Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Lateral micro-ion beam induced charge characterization of chemical vapor deposition diamond | |
| Lu, RR（陆嵘嵘）; Manfredotti, C; Fizzotti, F; Vittone, E; Logiudice, A | |
| 2002 | |
| Source Publication | MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY
 |
| ISSN | 0921-5107 |
| Volume | 90Issue:40910Pages:191 |
| Abstract | A lateral micro-ion beam induced charge technique has been used to obtain the charge collection efficiency (CCE) profiles at different biases applied on the growth electrode of chemical vapor deposition (CVD) diamond. A new linear model, only related to characteristic parameters (mobility x lifetime product) of CVD diamond, was reasonably proposed and checked by fitting the CCE profile. The results confirm that: (1) this CVD diamond is similar to a n-p junction film with bulk volume p type on the substrate side at the positive bias applied on the growth side; (2) in the case of negative bias, space charge on both sides may arise from donors/acceptors of the film and electrons/holes injected from the growth/ substrate side, but in the middle no space charge exists due to the electron-hole neutralization. (C) 2002 Elsevier Science B.V. All rights reserved. |
| Indexed By | SCI |
| Language | 英语 |
| Funding Project | 应物所项目组 |
| WOS ID | WOS:000174019500036 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/10034 |
| Collection | 中科院上海原子核所2003年前 |
| Recommended Citation GB/T 7714 | Lu, RR,Manfredotti, C,Fizzotti, F,et al. Lateral micro-ion beam induced charge characterization of chemical vapor deposition diamond[J]. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,2002,90(40910):191. |
| APA | Lu, RR,Manfredotti, C,Fizzotti, F,Vittone, E,&Logiudice, A.(2002).Lateral micro-ion beam induced charge characterization of chemical vapor deposition diamond.MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY,90(40910),191. |
| MLA | Lu, RR,et al."Lateral micro-ion beam induced charge characterization of chemical vapor deposition diamond".MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY 90.40910(2002):191. |
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