Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Observation of short-wavelength recorded pits in GeSb2Te4 phase change thin film by atomic force microscopy | |
| Men, LQ; Gan, FX; Sun, JL; Li, MQ（李民乾） | |
| 1997 | |
| Source Publication | APPLIED SURFACE SCIENCE
 |
| ISSN | 0169-4332 |
| Volume | 120Issue:40910Pages:171 |
| Abstract | Atomic force microscopy (AFM) was used to study the microstructure of short-wavelength recorded pits in GeSb2Te4 phase change thin film. Microarea morphology images show that the recorded domain bulges after laser irradiation, With the increase of writing pulse width, a depression appears in the center of the recorded pits, It is demonstrated that AFM is a very useful tool to evaluate the recorded pits and improve the performance of phase change media. (C) 1997 Elsevier Science B.V. |
| Indexed By | SCI |
| Language | 英语 |
| Funding Project | 应物所项目组 |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/10085 |
| Collection | 中科院上海原子核所2003年前 |
| Recommended Citation GB/T 7714 | Men, LQ,Gan, FX,Sun, JL,et al. Observation of short-wavelength recorded pits in GeSb2Te4 phase change thin film by atomic force microscopy[J]. APPLIED SURFACE SCIENCE,1997,120(40910):171. |
| APA | Men, LQ,Gan, FX,Sun, JL,&Li, MQ.(1997).Observation of short-wavelength recorded pits in GeSb2Te4 phase change thin film by atomic force microscopy.APPLIED SURFACE SCIENCE,120(40910),171. |
| MLA | Men, LQ,et al."Observation of short-wavelength recorded pits in GeSb2Te4 phase change thin film by atomic force microscopy".APPLIED SURFACE SCIENCE 120.40910(1997):171. |
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