~(67)Ga衰变的某些K壳内转换系数的测定

CAS OpenIR > 中科院上海原子核所2003年前

	~(67)Ga衰变的某些K壳内转换系数的测定
	郑万辉; 朱家璧; 顾加辉; 田家祺
	1982-06-30
Source Publication	核技术
Issue	06
Abstract	<正> 使用Si(Li)电子谱仪和Ge(Li)γ谱仪测定了~(67)Zn的5个跃迁的K内转换系数α_K。测量中使用归一化γ峰比电子峰的方法(NPG)。对以上二种探测器进行效率刻度;用BASIC语言编制γ谱和e谱的寻峰、求面积程序;在DIDAC-MULTI(8)系统上运算。
Indexed By	CNKI
Language	中文
Funding Project	原子核所项目组
Document Type	期刊论文
Identifier	http://ir.sinap.ac.cn/handle/331007/10752
Collection	中科院上海原子核所2003年前
Recommended Citation GB/T 7714	郑万辉,朱家璧,顾加辉,等. ~(67)Ga衰变的某些K壳内转换系数的测定[J]. 核技术,1982(06).
APA	郑万辉,朱家璧,顾加辉,&田家祺.(1982).~(67)Ga衰变的某些K壳内转换系数的测定.核技术(06).
MLA	郑万辉,et al."~(67)Ga衰变的某些K壳内转换系数的测定".核技术 .06(1982).

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