CAS OpenIR  > 中科院上海原子核所2003年前
~(67)Ga衰变率和~(67)Zn亚稳态有关核参数的测定
兰云霞; 谢炳华; 王章智
1980-05-30
Source Publication核技术
Issue05
Abstract本文描述了用4πx(LS)-γ符合技术测定~(67)Ga衰变率的精确方法[不确定度±0.05%(3σ)]。通过把X道的计数率外推到100%的效率和无限长的死时间;同时确定了子体~(67)Zn亚稳态的半衰期和内转换跃迁强度。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/10753
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
兰云霞,谢炳华,王章智. ~(67)Ga衰变率和~(67)Zn亚稳态有关核参数的测定[J]. 核技术,1980(05).
APA 兰云霞,谢炳华,&王章智.(1980).~(67)Ga衰变率和~(67)Zn亚稳态有关核参数的测定.核技术(05).
MLA 兰云霞,et al."~(67)Ga衰变率和~(67)Zn亚稳态有关核参数的测定".核技术 .05(1980).
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