CAS OpenIR  > 中科院上海原子核所2003年前
XYH-86小面积X荧光涂层测厚仪
乐安全; 林金锌; 朱节清; 谷英梅; 顾连学; 韩发生; 徐君权; 王裕政; 王志芳
1991-09-28
Source Publication核技术
Issue09
Abstract本仪器利用X射线荧光分析原理和微机技术研制而成的。以小型X射线管作激发源;射线用小孔准直;样品用光学定位;样品最小测量面直径为0.1mm。微机多道实时显示能谱。它能快速、精确、无损测量多种微小面积上的单、双涂层厚度和合金涂层厚度及成分;结果由屏幕显示并打印输出;还能作统计处理。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/11043
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
乐安全,林金锌,朱节清,等. XYH-86小面积X荧光涂层测厚仪[J]. 核技术,1991(09).
APA 乐安全.,林金锌.,朱节清.,谷英梅.,顾连学.,...&王志芳.(1991).XYH-86小面积X荧光涂层测厚仪.核技术(09).
MLA 乐安全,et al."XYH-86小面积X荧光涂层测厚仪".核技术 .09(1991).
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