CAS OpenIR  > 中科院上海原子核所2003年前
X射线荧光钛涂层厚度测量仪
徐君权; 乐安全; 韩发生; 朱节清; 谷英梅
1986-03-02
Source Publication核电子学与探测技术
Issue01
Abstract本文介绍一种X射线荧光测厚仪;用以测量钢基及钨基上的碳化钛或氮化钛涂层厚度。仪器测量范围为0.1—20μm;测量孔径为4mm。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/11047
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
徐君权,乐安全,韩发生,等. X射线荧光钛涂层厚度测量仪[J]. 核电子学与探测技术,1986(01).
APA 徐君权,乐安全,韩发生,朱节清,&谷英梅.(1986).X射线荧光钛涂层厚度测量仪.核电子学与探测技术(01).
MLA 徐君权,et al."X射线荧光钛涂层厚度测量仪".核电子学与探测技术 .01(1986).
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