CAS OpenIR  > 中科院上海原子核所2003年前
电致冷高分辨率 Si(Li)能谱仪
沈浩元; 浦世节; 张光明
1998-03-20
Source Publication核电子学与探测技术
Issue02
Abstract电致冷高分辨率Si(Li)X射线能谱分析仪采用电阻反馈前置放大器;灵敏面积为28mm2Si(Li)探测器;对55Fe5.9keVX射线;能量分辨率[FWHM]为700eV左右。对探测器在不同温度下随偏压的变化、致冷功率与温度关系、冷却温度与时间关系进行了研究。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/11285
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
沈浩元,浦世节,张光明. 电致冷高分辨率 Si(Li)能谱仪[J]. 核电子学与探测技术,1998(02).
APA 沈浩元,浦世节,&张光明.(1998).电致冷高分辨率 Si(Li)能谱仪.核电子学与探测技术(02).
MLA 沈浩元,et al."电致冷高分辨率 Si(Li)能谱仪".核电子学与探测技术 .02(1998).
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