电致冷高分辨率 Si(Li)能谱仪

CAS OpenIR > 中科院上海原子核所2003年前

	电致冷高分辨率 Si(Li)能谱仪
	沈浩元; 浦世节; 张光明
	1998-03-20
Source Publication	核电子学与探测技术
Issue	02
Abstract	电致冷高分辨率Ｓｉ（Ｌｉ）Ｘ射线能谱分析仪采用电阻反馈前置放大器;灵敏面积为２８ｍｍ２Ｓｉ（Ｌｉ）探测器;对５５Ｆｅ５．９ｋｅＶＸ射线;能量分辨率［ＦＷＨＭ］为７００ｅＶ左右。对探测器在不同温度下随偏压的变化、致冷功率与温度关系、冷却温度与时间关系进行了研究。
Indexed By	CNKI
Language	中文
Funding Project	原子核所项目组
Document Type	期刊论文
Identifier	http://ir.sinap.ac.cn/handle/331007/11285
Collection	中科院上海原子核所2003年前
Recommended Citation GB/T 7714	沈浩元,浦世节,张光明. 电致冷高分辨率 Si(Li)能谱仪[J]. 核电子学与探测技术,1998(02).
APA	沈浩元,浦世节,&张光明.(1998).电致冷高分辨率 Si(Li)能谱仪.核电子学与探测技术(02).
MLA	沈浩元,et al."电致冷高分辨率 Si(Li)能谱仪".核电子学与探测技术 .02(1998).

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