CAS OpenIR  > 中科院上海原子核所2003年前
非破坏质子激发X射线分析法测定固体材料成分
李民乾; 陈志祥
1980-12-31
Source Publication上海有色金属
IssueS1
Abstract<正> 一、引言质子激发X射线分析(PIXE)技术发展至今;极大多数的定量分析工作限于薄样品的分析。为了测定某些特殊规格的材料以及珍贵的样品成分;非破坏直接测定厚靶样品就显得十分重要;因此发展了厚靶定量分析技术。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/11370
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
李民乾,陈志祥. 非破坏质子激发X射线分析法测定固体材料成分[J]. 上海有色金属,1980(S1).
APA 李民乾,&陈志祥.(1980).非破坏质子激发X射线分析法测定固体材料成分.上海有色金属(S1).
MLA 李民乾,et al."非破坏质子激发X射线分析法测定固体材料成分".上海有色金属 .S1(1980).
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