CAS OpenIR  > 中科院上海原子核所2003年前
黄铜镀层成份分析仪
乐安全; 谷英梅; 顾连学
1990-05-31
Source Publication核技术
Issue05
Abstract本文简要介绍了黄铜镀层成份分析仪的测量原理和结构。它能快速、无损、精确地测定铁、镍基底上黄铜镀层(厚度为3—5μm)中的铜、锌百分含量;分析铜含量的精确度为0.6%。测量结束能显示和打印出铜、锌含量和铜含量误差。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/11574
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
乐安全,谷英梅,顾连学. 黄铜镀层成份分析仪[J]. 核技术,1990(05).
APA 乐安全,谷英梅,&顾连学.(1990).黄铜镀层成份分析仪.核技术(05).
MLA 乐安全,et al."黄铜镀层成份分析仪".核技术 .05(1990).
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