CAS OpenIR  > 中科院上海原子核所2003年前
金镀层测厚仪
乐安全; 韩发生; 徐君权; 朱节清; 谷英梅
1985-09-28
Source Publication核技术
Issue09
Abstract本文简要介绍了仪器的测量原理和结构。仪器的测量厚度范围不大于10μm;测量精密度小于±0.5μm。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/11660
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
乐安全,韩发生,徐君权,等. 金镀层测厚仪[J]. 核技术,1985(09).
APA 乐安全,韩发生,徐君权,朱节清,&谷英梅.(1985).金镀层测厚仪.核技术(09).
MLA 乐安全,et al."金镀层测厚仪".核技术 .09(1985).
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