Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
金镀层测厚仪 | |
乐安全; 韩发生; 徐君权; 朱节清; 谷英梅 | |
1985-09-28 | |
Source Publication | 核技术
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Issue | 09 |
Abstract | 本文简要介绍了仪器的测量原理和结构。仪器的测量厚度范围不大于10μm;测量精密度小于±0.5μm。 |
Indexed By | CNKI |
Language | 中文 |
Funding Project | 原子核所项目组 |
Document Type | 期刊论文 |
Identifier | http://ir.sinap.ac.cn/handle/331007/11660 |
Collection | 中科院上海原子核所2003年前 |
Recommended Citation GB/T 7714 | 乐安全,韩发生,徐君权,等. 金镀层测厚仪[J]. 核技术,1985(09). |
APA | 乐安全,韩发生,徐君权,朱节清,&谷英梅.(1985).金镀层测厚仪.核技术(09). |
MLA | 乐安全,et al."金镀层测厚仪".核技术 .09(1985). |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
金镀层测厚仪.caj(211KB) | 开放获取 | License | View Application Full Text |
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