CAS OpenIR  > 中科院上海原子核所2003年前
能量色散X射线分析中基本参数法的应用
陈志祥
1982-01-31
Source Publication核技术
Issue01
Abstract本文叙述了放射性同位素源激发能量色散X射线分析中基本参数法的原理、实验装置和计算机程序。在实验数据计算中;考虑了二次荧光的贡献;忽略了三次荧光强度。在本实验中;分析了砷化镓、碲化镉和不锈钢样品;结果与已知值进行了比较;准确度和精密度约在1%左右;样品分析时不需要标准;方法是非破坏的、可靠和有效的。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/11844
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
陈志祥. 能量色散X射线分析中基本参数法的应用[J]. 核技术,1982(01).
APA 陈志祥.(1982).能量色散X射线分析中基本参数法的应用.核技术(01).
MLA 陈志祥."能量色散X射线分析中基本参数法的应用".核技术 .01(1982).
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