CAS OpenIR  > 中科院上海原子核所2003年前
同位素激发X荧光分析测定铜保持器的磨损
鲍锦荣; 荣廷文; 林森浩; 章家鼎; 华芝芬; 邱瑞球; 高培明; 韩俊龙
1982
Source Publication核技术
Issue04
Abstract<正> 现我国纱厂用的纱锭轴承中的金属铜保持器有两种不同的生产工艺;为了解不同工艺生产的铜保持器在使用过程中的耐磨性能;采用同位素源激发X荧光分析法测定磨损后的轴承套内润滑油中铜的含量;来推断其耐磨性能。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/12061
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
鲍锦荣,荣廷文,林森浩,等. 同位素激发X荧光分析测定铜保持器的磨损[J]. 核技术,1982(04).
APA 鲍锦荣.,荣廷文.,林森浩.,章家鼎.,华芝芬.,...&韩俊龙.(1982).同位素激发X荧光分析测定铜保持器的磨损.核技术(04).
MLA 鲍锦荣,et al."同位素激发X荧光分析测定铜保持器的磨损".核技术 .04(1982).
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