CAS OpenIR  > 中科院上海原子核所2003年前
医用同位素~(125)I放射性强度的测定
归寿造; 梁渝生; 王功庆; 顾嘉辉
1981
Source Publication核技术
Issue02
Abstract<正> ~(125)I是发射低能γ的同位素;衰变纲图见图1。它通过电子俘获衰变到~(125)Te的激发态(其中产生的27.5keV KX射线;分支比为68.5%);然后经γ跃迁(发射35keVγ;分支比为6.4%)或发射内转换电子(也产生 上述KX射线;分支比为66.0%)退激到基态。 测定~(125)I溶液放射性强度的较好办法是采用单晶 NaI闪烁谱仪;利用γ能谱上的符合和峰(coincident sum peak)面积来推求之;它的γ能谱见图2。在这个 衰变过程中发射的LX射线能量3.8keV;很低;谱上记
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/12251
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
归寿造,梁渝生,王功庆,等. 医用同位素~(125)I放射性强度的测定[J]. 核技术,1981(02).
APA 归寿造,梁渝生,王功庆,&顾嘉辉.(1981).医用同位素~(125)I放射性强度的测定.核技术(02).
MLA 归寿造,et al."医用同位素~(125)I放射性强度的测定".核技术 .02(1981).
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