Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
用γ共振吸收方法测定~(24)Mg、~(40)Ca等核能级的短寿命 | |
顾锡良; 顾牡; 施德堂; 钱景华; 胡毓德; 顾加辉; 田家祺; 徐钧山; 郭箴第; 杨福家 | |
1989 | |
Source Publication | 核技术
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Issue | 02 |
Abstract | 本文介绍用γ共振吸收法测量~(28)Si、~(24)Mg和~(40)Ca三个核素部分高激发态能级寿命的实验结果;并对γ共振吸收法作了评述。 |
Indexed By | CNKI |
Language | 中文 |
Funding Project | 原子核所项目组 |
Document Type | 期刊论文 |
Identifier | http://ir.sinap.ac.cn/handle/331007/12285 |
Collection | 中科院上海原子核所2003年前 |
Recommended Citation GB/T 7714 | 顾锡良,顾牡,施德堂,等. 用γ共振吸收方法测定~(24)Mg、~(40)Ca等核能级的短寿命[J]. 核技术,1989(02). |
APA | 顾锡良.,顾牡.,施德堂.,钱景华.,胡毓德.,...&杨福家.(1989).用γ共振吸收方法测定~(24)Mg、~(40)Ca等核能级的短寿命.核技术(02). |
MLA | 顾锡良,et al."用γ共振吸收方法测定~(24)Mg、~(40)Ca等核能级的短寿命".核技术 .02(1989). |
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