CAS OpenIR  > 中科院上海原子核所2003年前
用薄层活化法测定活塞环的磨损
鲍锦荣; 陶菲; 郭莲英
1978
Source Publication机车车辆工艺
Issue05
Abstract<正> 现代机器上的摩擦副多在高速、高载工况下工作;摩擦条件恶化;磨损量增大;有些摩擦件稍有磨损就会使机器不能正常运转;甚至会造成重大事故。为了保证机器的可靠工作;不得不花费大量的材料和人力;占用大量的设备来制造受到摩擦磨损的零件。因此;如何改善摩擦条件和减少磨损具有重要的意义;对于摩擦磨损的机理及其测试方法的研究也必须给予极大的重视。在早期的磨损测试方法中;有机械测厚、称量、刻痕等。当磨损量较小;对测试方法的灵敏度要求越来越高时;这些方法就不能满足
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/12290
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
鲍锦荣,陶菲,郭莲英. 用薄层活化法测定活塞环的磨损[J]. 机车车辆工艺,1978(05).
APA 鲍锦荣,陶菲,&郭莲英.(1978).用薄层活化法测定活塞环的磨损.机车车辆工艺(05).
MLA 鲍锦荣,et al."用薄层活化法测定活塞环的磨损".机车车辆工艺 .05(1978).
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