CAS OpenIR  > 中科院上海原子核所2003年前
用电子湮灭方法测位错密度
王振杰; 彭郁卿; 袁鹤令; 王景成
1981
Source Publication上海钢研
Issue01
Abstract<正> 前言 晶体缺陷的研究目前已经突破范性形变这一传统领域;渗透到金属、固体电磁性能方面;但它的测量方法始终在探讨;主要的常用方法有金相显微镜及X射线法。近年来采用电子显微镜;不仅可测位错密度;且能直接观察缺陷的形态。但存在的共同问题是这些方法均受到试样制备的限制;而且试样表面位错密度与体内有差异;尤其是当缺
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/12299
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
王振杰,彭郁卿,袁鹤令,等. 用电子湮灭方法测位错密度[J]. 上海钢研,1981(01).
APA 王振杰,彭郁卿,袁鹤令,&王景成.(1981).用电子湮灭方法测位错密度.上海钢研(01).
MLA 王振杰,et al."用电子湮灭方法测位错密度".上海钢研 .01(1981).
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