CAS OpenIR  > 中科院上海原子核所2003年前
用于核态寿命测量的X-γ-γ定时符合系统
顾嘉辉; 刘静怡; 何四言; 余笑寒; 曾寄萍; 曹玉祥; 李燕; 石双惠
1998
Source Publication核技术
Issue04
Abstract由两只BaF2闪烁探测器和一只高纯锗探测器组成的延迟符合系统适用于电子俘获衰变和E0跃迁生成的ns和ps量级激发态寿命测量。快符合涉及特征X射线和相应的级联衰变γ射线测量;系统具有元素和级联选择的优点。该系统对放射性核素152 ̄Eu进行测量;除得到X-γ-γ瞬发时间谱的半高全宽度外;还分别得到121.78keV和366.48keV能级的半寿命分别为1.395±0.035ns和48±10ps。结果表明该系统适用于Z≥62的电子俘获衰变研究。
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/12352
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
顾嘉辉,刘静怡,何四言,等. 用于核态寿命测量的X-γ-γ定时符合系统[J]. 核技术,1998(04).
APA 顾嘉辉.,刘静怡.,何四言.,余笑寒.,曾寄萍.,...&石双惠.(1998).用于核态寿命测量的X-γ-γ定时符合系统.核技术(04).
MLA 顾嘉辉,et al."用于核态寿命测量的X-γ-γ定时符合系统".核技术 .04(1998).
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