CAS OpenIR  > 中科院上海原子核所2003年前
质子活化分析测定硅中氧——热解法分离~(18)F
成源棣; 朱新芳; 华芝芬
1980
Source Publication核技术
Issue06
Abstract<正> 采用1.2米回旋加速器产生的质子束(6.7MeV、约8μA)照射硅样品;使氧发生~(18)O(p;n)~(18)F核反应;~(18)F半衰期为110分。辐照后用化学处理腐蚀表面;然后用热解分离法分离出~(18)F;用蒸馏水吸收、处理转化
Indexed ByCNKI
Language中文
Funding Project原子核所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/12423
Collection中科院上海原子核所2003年前
Recommended Citation
GB/T 7714
成源棣,朱新芳,华芝芬. 质子活化分析测定硅中氧——热解法分离~(18)F[J]. 核技术,1980(06).
APA 成源棣,朱新芳,&华芝芬.(1980).质子活化分析测定硅中氧——热解法分离~(18)F.核技术(06).
MLA 成源棣,et al."质子活化分析测定硅中氧——热解法分离~(18)F".核技术 .06(1980).
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