CAS OpenIR  > 中科院上海应用物理研究所2004-2010年
Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films
Liu, Huajun; Yao, Kui; Yang, Ping; Du, Yonghua; He, Qing(何庆); Gu, Yueliang(顾月良); Li, Xiaolong(李晓龙); Wang, Sisheng(王思胜); Zhou, Xingtai(周兴泰); Wang, John
2010
Source PublicationPHYSICAL REVIEW B
ISSN1098-0121
Volume82Issue:6
AbstractWith increasing film thickness of the epitaxial BiFeO3 (001) films deposited on SrTiO3 substrates from 30 to 720 nm, the crystal structure evolutes from a fully strained tetragonal lattice to partially relaxed monoclinic one with rotated twins. Although the mismatch strain results in a significant lattice distortion and twinning evolution, the polarization does not show a direct correlation with strain. Instead, there is a strong dependence of polarization on the body diagonal length of the distorted pseudocubic unit cell. The distortion in the polarization direction is the critical parameter, other than strain, that determines the polarization in the monoclinic phase ferroelectric thin films.
Indexed BySCI
Language英语
Funding Project应物所项目组
WOS IDWOS:000281064100002
Citation statistics
Cited Times:29[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/13062
Collection中科院上海应用物理研究所2004-2010年
Recommended Citation
GB/T 7714
Liu, Huajun,Yao, Kui,Yang, Ping,et al. Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films[J]. PHYSICAL REVIEW B,2010,82(6).
APA Liu, Huajun.,Yao, Kui.,Yang, Ping.,Du, Yonghua.,He, Qing.,...&Wang, John.(2010).Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films.PHYSICAL REVIEW B,82(6).
MLA Liu, Huajun,et al."Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films".PHYSICAL REVIEW B 82.6(2010).
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