Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films | |
| Liu, Huajun; Yao, Kui; Yang, Ping; Du, Yonghua; He, Qing（何庆）; Gu, Yueliang（顾月良）; Li, Xiaolong（李晓龙）; Wang, Sisheng（王思胜）; Zhou, Xingtai（周兴泰）; Wang, John | |
| 2010 | |
| Source Publication | PHYSICAL REVIEW B
 |
| ISSN | 1098-0121 |
| Volume | 82Issue:6 |
| Abstract | With increasing film thickness of the epitaxial BiFeO3 (001) films deposited on SrTiO3 substrates from 30 to 720 nm, the crystal structure evolutes from a fully strained tetragonal lattice to partially relaxed monoclinic one with rotated twins. Although the mismatch strain results in a significant lattice distortion and twinning evolution, the polarization does not show a direct correlation with strain. Instead, there is a strong dependence of polarization on the body diagonal length of the distorted pseudocubic unit cell. The distortion in the polarization direction is the critical parameter, other than strain, that determines the polarization in the monoclinic phase ferroelectric thin films. |
| Indexed By | SCI |
| Language | 英语 |
| Funding Project | 应物所项目组 |
| WOS ID | WOS:000281064100002 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/13062 |
| Collection | 中科院上海应用物理研究所2004-2010年 |
| Recommended Citation GB/T 7714 | Liu, Huajun,Yao, Kui,Yang, Ping,et al. Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films[J]. PHYSICAL REVIEW B,2010,82(6). |
| APA | Liu, Huajun.,Yao, Kui.,Yang, Ping.,Du, Yonghua.,He, Qing.,...&Wang, John.(2010).Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films.PHYSICAL REVIEW B,82(6). |
| MLA | Liu, Huajun,et al."Thickness-dependent twinning evolution and ferroelectric behavior of epitaxial BiFeO3 (001) thin films".PHYSICAL REVIEW B 82.6(2010). |
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