CAS OpenIR  > 中科院上海应用物理研究所2011-2019年
Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples
Li, WB; Yang, XY; Zhu, JT; Tu, YC; Mu, BZ; Yu, HS; Wei, XJ; Huang, YY; Wang, ZS; wangzs@tongji.edu.cn
2014
Source PublicationJOURNAL OF SYNCHROTRON RADIATION
ISSN0909-0495
Volume21Pages:561—567
AbstractA novel correction method for self-absorption effects is proposed for extended X-ray absorption fine structure (EXAFS) detected in the fluorescence mode on multilayer samples. The effects of refraction and multiple reflection at the interfaces are fully considered in this correction method. The correction is performed in k-space before any further data analysis, and it can be applied to single-layer or multilayer samples with flat surfaces and without thickness limit when the model parameters for the samples are known. The validity of this method is verified by the fluorescence EXAFS data collected for a Cr/C multilayer sample measured at different experimental geometries.
KeywordThin-films Concentrated Samples Scattering Spectra Reflectivity Parameter Exafs Xafs
Indexed BySCI
Language英语
WOS IDWOS:000335142900014
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/14057
Collection中科院上海应用物理研究所2011-2019年
Corresponding Authorwangzs@tongji.edu.cn
Recommended Citation
GB/T 7714
Li, WB,Yang, XY,Zhu, JT,et al. Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples[J]. JOURNAL OF SYNCHROTRON RADIATION,2014,21:561—567.
APA Li, WB.,Yang, XY.,Zhu, JT.,Tu, YC.,Mu, BZ.,...&wangzs@tongji.edu.cn.(2014).Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples.JOURNAL OF SYNCHROTRON RADIATION,21,561—567.
MLA Li, WB,et al."Correction method for the self-absorption effects in fluorescence extended X-ray absorption fine structure on multilayer samples".JOURNAL OF SYNCHROTRON RADIATION 21(2014):561—567.
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