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Depth-dependent inhomogeneous characteristics in supported glassy polystyrene films revealed by ultra-low X-ray reflectivity measurements
Yang, CM; Ishimoto, K; Matsuura, S; Koyasu, N; Takahashi, I; yangchunming@sinap.ac.cn; z96019@kwansei.ac.jp
2014
Source PublicationPOLYMER JOURNAL
ISSN0032-3896
Volume46Issue:12Pages:873—879
AbstractThis study reports X-ray reflectivity measurements of the glass transition of polystyrene thin films supported on Si substrates and heated at low heating rates that ranged from 0.14 to 0.01 degrees C min(-1). At a heating rate of 0.14 degrees C min(-1), the glass transition temperature T-g was independent of the film thickness down to a thickness of 6 nm. However, at a heating rate of 0.04 degrees C min(-1), the value of T-g decreased with decreased thickness. The reduction in T-g was most significant at the ultra-low heating rate of 0.01 degrees C min(-1). Furthermore, with decreased film thickness, the linear thermal expansivity in the glassy state alpha(glass) slightly decreased at a heating rate of 0.14 degrees C min(-1), whereas alpha(glass) exhibited a significant increase at the ultra-low heating rate of 0.01 degrees C min(-1). Reconstructed depth profiles of thermal expansivity, which were obtained by fitting the alpha(glass) values using an integral model, indicated a decrease in the thickness of the interfacial dead layer with a decrease in the heating rate, whereas the volume fraction of the free surface region increased under this condition. The observed reduction in T-g can be attributed to surface and interface effects perturbing the glass transition dynamics of the thin films under slower probing conditions.
KeywordThin Polymer Layers Transition Temperatures Molecular-weight Dynamics Interface Surface Motion Confinement Thickness Mobility
Indexed BySCI
Language英语
WOS IDWOS:000346086000005
Citation statistics
Cited Times:2[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/14066
Collection中科院上海应用物理研究所2011-2019年
Corresponding Authoryangchunming@sinap.ac.cn; z96019@kwansei.ac.jp
Recommended Citation
GB/T 7714
Yang, CM,Ishimoto, K,Matsuura, S,et al. Depth-dependent inhomogeneous characteristics in supported glassy polystyrene films revealed by ultra-low X-ray reflectivity measurements[J]. POLYMER JOURNAL,2014,46(12):873—879.
APA Yang, CM.,Ishimoto, K.,Matsuura, S.,Koyasu, N.,Takahashi, I.,...&z96019@kwansei.ac.jp.(2014).Depth-dependent inhomogeneous characteristics in supported glassy polystyrene films revealed by ultra-low X-ray reflectivity measurements.POLYMER JOURNAL,46(12),873—879.
MLA Yang, CM,et al."Depth-dependent inhomogeneous characteristics in supported glassy polystyrene films revealed by ultra-low X-ray reflectivity measurements".POLYMER JOURNAL 46.12(2014):873—879.
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