CAS OpenIR  > 中科院上海应用物理研究所2011-2020年
High Accuracy Sample Positioning System for Hard X-Ray Microprobe
Zhang, JC; Liang, DX; He, Y; Li, AG; Yu, XH; zjchao@sinap.ac.cn; yuxiaohan@sinap.ac.cn
2014
Source PublicationSPECTROSCOPY AND SPECTRAL ANALYSIS
ISSN1000-0593
Volume34Issue:2Pages:557—561
AbstractA novel sample offline positioning system was developed for hard X-ray micro-focus beamline (BL15U1) at Shanghai Synchrotron Radiation Facility (SSRF). The positioning system is composed of three parts: off-line sample microscope system, on-line sample experiment system, and high-precision positioning sample holder. It makes a potent combination of the on-line X-ray fluorescence imaging and the off-line microscopic examination in three steps: compiling of control program, positioning of sample holder, and conversion of the two coordinates. It's the first time in the domestic synchrotron radiation facilities to achieve sample offline positioning in micron scale. The system helps the researchers find the object of study in micro zone quickly and accurately, when they study the micro characteristics of materials using synchrotron radiation micro X-ray beam. The gold mesh was used as an object of study. By comparing the differences of coordinates of gold mesh nodes between pictures from offline microscope and pictures from X-ray fluorescence mapping, the accuracy of the offline positioning system was verified. The results showed that the average errors of X-axis and Z-axis were 1. 3 and 2. 5 mu m respectively, using the positioning method. It was demonstrated that the sample offline positioning system not only is suitable for these applications with high efficiency, but also supply hard X-ray micro-focus beamline with the technical preparations of sample automatic focusing method.
KeywordFluorescence Microscopy Transition Copper
Indexed BySCI
Language中文
WOS IDWOS:000331427400053
Citation statistics
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/14168
Collection中科院上海应用物理研究所2011-2020年
Corresponding Authorzjchao@sinap.ac.cn; yuxiaohan@sinap.ac.cn
Recommended Citation
GB/T 7714
Zhang, JC,Liang, DX,He, Y,et al. High Accuracy Sample Positioning System for Hard X-Ray Microprobe[J]. SPECTROSCOPY AND SPECTRAL ANALYSIS,2014,34(2):557—561.
APA Zhang, JC.,Liang, DX.,He, Y.,Li, AG.,Yu, XH.,...&yuxiaohan@sinap.ac.cn.(2014).High Accuracy Sample Positioning System for Hard X-Ray Microprobe.SPECTROSCOPY AND SPECTRAL ANALYSIS,34(2),557—561.
MLA Zhang, JC,et al."High Accuracy Sample Positioning System for Hard X-Ray Microprobe".SPECTROSCOPY AND SPECTRAL ANALYSIS 34.2(2014):557—561.
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