Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering | |
| Li, HC; Zhu, JT; Wang, ZS; Chen, H; Wang, YZ; Wang, J; jtzhu@tongji.edu.cn | |
| 2014 | |
| Source Publication | JOURNAL OF SYNCHROTRON RADIATION
 |
| ISSN | 0909-0495 |
| Volume | 21Pages:97—103 |
| Abstract | An integration method is demonstrated for directly determining the average interface statistics of periodic multilayers from the X-ray scattering diagram. By measuring the X-ray scattering diagram in the out-of-plane geometry and integrating the scattered intensity along the vertical momentum transfer q(z) in an interval, which is decided by the thickness ratio Gamma (ratio of sublayer's thickness to periodic thickness), the cross-correlations between different interfaces are canceled and only the autocorrelations are reserved. Then the multilayer can be treated as a 'single interface' and the average power spectral density can be obtained without assuming any vertical correlation model. This method has been employed to study the interface morphology of sputter-deposited W/Si multilayers grown at an Ar pressure of 1-7 mTorr. The results show an increase in vertical correlation length and a decrease in lateral correlation length with increased Ar pressure. The static roughness exponent alpha = 0 and dynamic growth exponent z = 2 indicate the Edwards-Wilkinson growth model at an Ar pressure of 1-5 mTorr. At an Ar pressure of 7 mTorr, alpha = 0.35 and z = 1.65 indicate the Kardar-Parisi-Zhang growth model. |
| Keyword | Sputtering Pressure Diffuse-scattering Roughness Performance Surface Film |
| Indexed By | SCI |
| Language | 英语 |
| WOS ID | WOS:000328939400012 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/14199 |
| Collection | 中科院上海应用物理研究所2011-2019年 |
| Corresponding Author | jtzhu@tongji.edu.cn |
| Recommended Citation GB/T 7714 | Li, HC,Zhu, JT,Wang, ZS,et al. Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering[J]. JOURNAL OF SYNCHROTRON RADIATION,2014,21:97—103. |
| APA | Li, HC.,Zhu, JT.,Wang, ZS.,Chen, H.,Wang, YZ.,...&jtzhu@tongji.edu.cn.(2014).Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering.JOURNAL OF SYNCHROTRON RADIATION,21,97—103. |
| MLA | Li, HC,et al."Integration method for directly analyzing interface statistics of periodic multilayers from X-ray scattering".JOURNAL OF SYNCHROTRON RADIATION 21(2014):97—103. |
| Files in This Item: | Download All | |||||
| File Name/Size | DocType | Version | Access | License | ||
| Integration method f（845KB） | 开放获取 | CC BY-NC-SA | View Download | |||
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment