Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets | |
| Shen, Y; Wang, Y; Zhang, JJ; Hai, CX; Zhou, Y; Hu, J; Zhang, Y; zhangyi@sinap.ac.cn | |
| 2014 | |
| Source Publication | JOURNAL OF APPLIED PHYSICS
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| ISSN | 0021-8979 |
| Volume | 115Issue:24 |
| Abstract | A unique operation mode of scanning polarization force microscopy (SPFM) was developed for characterizing reduced graphene oxide (rGO) sheets that were individually charged, mainly by monitoring the change of the sample's apparent height along with its surface potential. The principles and features of this sample-charged mode SPFM (SC-SPFM) were introduced. By comparing with other scanning-probe based techniques that characterize the surface electrical properties, including the traditional tip-biased mode SPFM, electrostatic force microscopy, and Kelvin probe force microscopy, it was found that the SC-SPFM has higher sensitivity and lateral resolution. Furthermore, by monitoring charge transfer between two rGO sheets with SC-SPFM, the "good"or "bad"contacts related to junction geometry at the nanometer scale can be visualized clearly. (C) 2014 AIP Publishing LLC. |
| Keyword | Wetting Properties Graphite Oxide Water Glycerol Condensation Liquids Single Mica |
| Indexed By | SCI |
| Language | 英语 |
| WOS ID | WOS:000338633600035 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/14374 |
| Collection | 中科院上海应用物理研究所2011-2020年 |
| Corresponding Author | zhangyi@sinap.ac.cn |
| Recommended Citation GB/T 7714 | Shen, Y,Wang, Y,Zhang, JJ,et al. Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets[J]. JOURNAL OF APPLIED PHYSICS,2014,115(24). |
| APA | Shen, Y.,Wang, Y.,Zhang, JJ.,Hai, CX.,Zhou, Y.,...&zhangyi@sinap.ac.cn.(2014).Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets.JOURNAL OF APPLIED PHYSICS,115(24). |
| MLA | Shen, Y,et al."Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets".JOURNAL OF APPLIED PHYSICS 115.24(2014). |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Sample-charged mode （2260KB） | 开放获取 | CC BY-NC-SA | View Application Full Text | |||
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