CAS OpenIR  > 中科院上海应用物理研究所2011-2019年
Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets
Shen, Y; Wang, Y; Zhang, JJ; Hai, CX; Zhou, Y; Hu, J; Zhang, Y; zhangyi@sinap.ac.cn
2014
Source PublicationJOURNAL OF APPLIED PHYSICS
ISSN0021-8979
Volume115Issue:24
AbstractA unique operation mode of scanning polarization force microscopy (SPFM) was developed for characterizing reduced graphene oxide (rGO) sheets that were individually charged, mainly by monitoring the change of the sample's apparent height along with its surface potential. The principles and features of this sample-charged mode SPFM (SC-SPFM) were introduced. By comparing with other scanning-probe based techniques that characterize the surface electrical properties, including the traditional tip-biased mode SPFM, electrostatic force microscopy, and Kelvin probe force microscopy, it was found that the SC-SPFM has higher sensitivity and lateral resolution. Furthermore, by monitoring charge transfer between two rGO sheets with SC-SPFM, the "good"or "bad"contacts related to junction geometry at the nanometer scale can be visualized clearly. (C) 2014 AIP Publishing LLC.
KeywordWetting Properties Graphite Oxide Water Glycerol Condensation Liquids Single Mica
Indexed BySCI
Language英语
WOS IDWOS:000338633600035
Citation statistics
Cited Times:7[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/14374
Collection中科院上海应用物理研究所2011-2019年
Corresponding Authorzhangyi@sinap.ac.cn
Recommended Citation
GB/T 7714
Shen, Y,Wang, Y,Zhang, JJ,et al. Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets[J]. JOURNAL OF APPLIED PHYSICS,2014,115(24).
APA Shen, Y.,Wang, Y.,Zhang, JJ.,Hai, CX.,Zhou, Y.,...&zhangyi@sinap.ac.cn.(2014).Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets.JOURNAL OF APPLIED PHYSICS,115(24).
MLA Shen, Y,et al."Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets".JOURNAL OF APPLIED PHYSICS 115.24(2014).
Files in This Item: Download All
File Name/Size DocType Version Access License
Sample-charged mode (2260KB) 开放获取CC BY-NC-SAView Download
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Shen, Y]'s Articles
[Wang, Y]'s Articles
[Zhang, JJ]'s Articles
Baidu academic
Similar articles in Baidu academic
[Shen, Y]'s Articles
[Wang, Y]'s Articles
[Zhang, JJ]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Shen, Y]'s Articles
[Wang, Y]'s Articles
[Zhang, JJ]'s Articles
Terms of Use
No data!
Social Bookmark/Share
File name: Sample-charged mode scanning polarization force microscopy for characterizing reduced graphene oxide sheets.pdf
Format: Adobe PDF
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.