Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| X-ray Imaging for Non-Destructive Microstructure Analysis at SSRF | |
| Chen, RC; Liu, P; Xiao, TQ; Xu, LX; tqxiao@sinap.ac.cn; lisaxu@sjtu.edu.cn | |
| 2014 | |
| Source Publication | ADVANCED MATERIALS
 |
| ISSN | 0935-9648 |
| Volume | 26Issue:46Pages:7688—7691 |
| Keyword | Synchrotron-radiation Computed-tomography Phase Retrieval Angiography Distance |
| Indexed By | SCI |
| Language | 英语 |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/14570 |
| Collection | 中科院上海应用物理研究所2011-2020年 |
| Corresponding Author | tqxiao@sinap.ac.cn; lisaxu@sjtu.edu.cn |
| Recommended Citation GB/T 7714 | Chen, RC,Liu, P,Xiao, TQ,et al. X-ray Imaging for Non-Destructive Microstructure Analysis at SSRF[J]. ADVANCED MATERIALS,2014,26(46):7688—7691. |
| APA | Chen, RC,Liu, P,Xiao, TQ,Xu, LX,tqxiao@sinap.ac.cn,&lisaxu@sjtu.edu.cn.(2014).X-ray Imaging for Non-Destructive Microstructure Analysis at SSRF.ADVANCED MATERIALS,26(46),7688—7691. |
| MLA | Chen, RC,et al."X-ray Imaging for Non-Destructive Microstructure Analysis at SSRF".ADVANCED MATERIALS 26.46(2014):7688—7691. |
| Files in This Item: | Download All | |||||
| File Name/Size | DocType | Version | Access | License | ||
| X-ray Imaging for No（203KB） | 开放获取 | CC BY-NC-SA | View Download | |||
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