CAS OpenIR  > 中科院上海应用物理研究所2011-2019年
X-ray Imaging for Non-Destructive Microstructure Analysis at SSRF
Chen, RC; Liu, P; Xiao, TQ; Xu, LX; tqxiao@sinap.ac.cn; lisaxu@sjtu.edu.cn
2014
Source PublicationADVANCED MATERIALS
ISSN0935-9648
Volume26Issue:46Pages:7688—7691
KeywordSynchrotron-radiation Computed-tomography Phase Retrieval Angiography Distance
Indexed BySCI
Language英语
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/14571
Collection中科院上海应用物理研究所2011-2019年
Corresponding Authortqxiao@sinap.ac.cn; lisaxu@sjtu.edu.cn
Recommended Citation
GB/T 7714
Chen, RC,Liu, P,Xiao, TQ,et al. X-ray Imaging for Non-Destructive Microstructure Analysis at SSRF[J]. ADVANCED MATERIALS,2014,26(46):7688—7691.
APA Chen, RC,Liu, P,Xiao, TQ,Xu, LX,tqxiao@sinap.ac.cn,&lisaxu@sjtu.edu.cn.(2014).X-ray Imaging for Non-Destructive Microstructure Analysis at SSRF.ADVANCED MATERIALS,26(46),7688—7691.
MLA Chen, RC,et al."X-ray Imaging for Non-Destructive Microstructure Analysis at SSRF".ADVANCED MATERIALS 26.46(2014):7688—7691.
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