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| Latest advances in soft X-ray spectromicroscopy at SSRF | |
| Zhang, LJ; Xu, ZJ; Zhang, XZ; Yu, HN; Zou, Y; Guo, Z; Zhen, XJ; Cao, JF; Meng, XY; Li, JQ; Chen, ZH; Wang, Y; Tai, RZ; Zhang, LJ (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai 201800, Peoples R China. | |
| 2015 | |
| Source Publication | NUCLEAR SCIENCE AND TECHNIQUES
 |
| ISSN | 1001-8042 |
| Volume | 26Issue:4Pages:— |
| Subtype | 期刊文献 |
| Abstract | The BL08U1A beamline is established as a sophisticated platform at Shanghai Synchrotron Radiation Facility (SSRF), taking advantage of its high spatial resolution (< 30 nm) and high energy resolving power (>10 000), for studying properties of solid, liquid, gas, film and other forms of materials at sub-micron scale. In this paper, we present a review on newly implemented techniques, such as total electron yield (TEY), dual energy contrast imaging, nano-CT, soft X-ray excited optical luminance (SXEOL), and coherent diffraction imaging (CDI) under development. Several research cases in nanomaterials, environmental science and biology are presented to demonstrate capabilities of the beamline. |
| Keyword | Spatial-resolution Microscopy Crystallography Nanoparticles Spectroscopy Absorption Surface |
| Language | 英语 |
| WOS ID | WOS:000361645000001 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/24980 |
| Collection | 中科院上海应用物理研究所2011-2020年 |
| Corresponding Author | Zhang, LJ (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai 201800, Peoples R China. |
| Recommended Citation GB/T 7714 | Zhang, LJ,Xu, ZJ,Zhang, XZ,et al. Latest advances in soft X-ray spectromicroscopy at SSRF[J]. NUCLEAR SCIENCE AND TECHNIQUES,2015,26(4):—. |
| APA | Zhang, LJ.,Xu, ZJ.,Zhang, XZ.,Yu, HN.,Zou, Y.,...&Zhang, LJ .(2015).Latest advances in soft X-ray spectromicroscopy at SSRF.NUCLEAR SCIENCE AND TECHNIQUES,26(4),—. |
| MLA | Zhang, LJ,et al."Latest advances in soft X-ray spectromicroscopy at SSRF".NUCLEAR SCIENCE AND TECHNIQUES 26.4(2015):—. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Latest advances in s（1558KB） | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | View Application Full Text | |
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