Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses
Jiang, H; He, Y; He, YM; Li, AG; Wang, H; Zheng, Y; Dong, ZH; Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
2015
发表期刊JOURNAL OF SYNCHROTRON RADIATION
ISSN1600-5775
卷号22页码:1379—1385
文章类型期刊文献
摘要Ru/C multilayer monochromators with different periodic thicknesses were investigated using X-ray grazing-incidence reflectivity, diffuse scattering, Bragg imaging, morphology testing, etc. before and after cryogenic cooling. Quantitative analyses enabled the determination of the key multilayer structural parameters for samples with different periodic thicknesses, especially the influence from the ruthenium crystallization. The results also reveal that the basic structures and reflection performance keep stable after cryogenic cooling. The low-temperature treatment smoothed the surfaces and interfaces and changed the growth characteristic to a low-frequency surface figure. This study helps with the understanding of the structure evolution of multilayer monochromators during cryogenic cooling and presents sufficient experimental proof for using cryogenically cooled multilayer monochromators in a high-thermal-load undulator beamline.
关键词Coherent Synchrotron-radiation X-ray Total-reflection Scattering Optics
语种英语
WOS记录号WOS:000364422100008
引用统计
被引频次:2[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.sinap.ac.cn/handle/331007/25050
专题中科院上海应用物理研究所2011-2018年
通讯作者Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
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GB/T 7714
Jiang, H,He, Y,He, YM,et al. Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses[J]. JOURNAL OF SYNCHROTRON RADIATION,2015,22:1379—1385.
APA Jiang, H.,He, Y.,He, YM.,Li, AG.,Wang, H.,...&Jiang, H .(2015).Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses.JOURNAL OF SYNCHROTRON RADIATION,22,1379—1385.
MLA Jiang, H,et al."Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses".JOURNAL OF SYNCHROTRON RADIATION 22(2015):1379—1385.
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