Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses

CAS OpenIR > 中科院上海应用物理研究所2011-2018年

	Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses
	Jiang, H; He, Y; He, YM; Li, AG; Wang, H; Zheng, Y; Dong, ZH; Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
	2015
发表期刊	JOURNAL OF SYNCHROTRON RADIATION
ISSN	1600-5775
卷号	22 页码:1379—1385
文章类型	期刊文献
摘要	Ru/C multilayer monochromators with different periodic thicknesses were investigated using X-ray grazing-incidence reflectivity, diffuse scattering, Bragg imaging, morphology testing, etc. before and after cryogenic cooling. Quantitative analyses enabled the determination of the key multilayer structural parameters for samples with different periodic thicknesses, especially the influence from the ruthenium crystallization. The results also reveal that the basic structures and reflection performance keep stable after cryogenic cooling. The low-temperature treatment smoothed the surfaces and interfaces and changed the growth characteristic to a low-frequency surface figure. This study helps with the understanding of the structure evolution of multilayer monochromators during cryogenic cooling and presents sufficient experimental proof for using cryogenically cooled multilayer monochromators in a high-thermal-load undulator beamline.
关键词	Coherent Synchrotron-radiation X-ray Total-reflection Scattering Optics
语种	英语
WOS记录号	WOS:000364422100008
引用统计	被引频次：2[WOS] [WOS记录] [WOS相关记录]
文献类型	期刊论文
条目标识符	http://ir.sinap.ac.cn/handle/331007/25050
专题	中科院上海应用物理研究所2011-2018年
通讯作者	Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
推荐引用方式 GB/T 7714	Jiang, H,He, Y,He, YM,et al. Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses[J]. JOURNAL OF SYNCHROTRON RADIATION,2015,22:1379—1385.
APA	Jiang, H.,He, Y.,He, YM.,Li, AG.,Wang, H.,...&Jiang, H .(2015).Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses.JOURNAL OF SYNCHROTRON RADIATION,22,1379—1385.
MLA	Jiang, H,et al."Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses".JOURNAL OF SYNCHROTRON RADIATION 22(2015):1379—1385.

条目包含的文件		下载所有文件
文件名称/大小	文献类型	版本类型	开放类型	使用许可
Structural evolution（1563KB）	期刊论文	作者接受稿	开放获取	CC BY-NC-SA	浏览下载