Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses | |
| Jiang, H; He, Y; He, YM; Li, AG; Wang, H; Zheng, Y; Dong, ZH; Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China. | |
| 2015 | |
| Source Publication | JOURNAL OF SYNCHROTRON RADIATION
 |
| ISSN | 1600-5775 |
| Volume | 22Pages:1379—1385 |
| Subtype | 期刊文献 |
| Abstract | Ru/C multilayer monochromators with different periodic thicknesses were investigated using X-ray grazing-incidence reflectivity, diffuse scattering, Bragg imaging, morphology testing, etc. before and after cryogenic cooling. Quantitative analyses enabled the determination of the key multilayer structural parameters for samples with different periodic thicknesses, especially the influence from the ruthenium crystallization. The results also reveal that the basic structures and reflection performance keep stable after cryogenic cooling. The low-temperature treatment smoothed the surfaces and interfaces and changed the growth characteristic to a low-frequency surface figure. This study helps with the understanding of the structure evolution of multilayer monochromators during cryogenic cooling and presents sufficient experimental proof for using cryogenically cooled multilayer monochromators in a high-thermal-load undulator beamline. |
| Keyword | Coherent Synchrotron-radiation X-ray Total-reflection Scattering Optics |
| Language | 英语 |
| WOS ID | WOS:000364422100008 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/25050 |
| Collection | 中科院上海应用物理研究所2011-2019年 |
| Corresponding Author | Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China. |
| Recommended Citation GB/T 7714 | Jiang, H,He, Y,He, YM,et al. Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses[J]. JOURNAL OF SYNCHROTRON RADIATION,2015,22:1379—1385. |
| APA | Jiang, H.,He, Y.,He, YM.,Li, AG.,Wang, H.,...&Jiang, H .(2015).Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses.JOURNAL OF SYNCHROTRON RADIATION,22,1379—1385. |
| MLA | Jiang, H,et al."Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses".JOURNAL OF SYNCHROTRON RADIATION 22(2015):1379—1385. |
| Files in This Item: | Download All | |||||
| File Name/Size | DocType | Version | Access | License | ||
| Structural evolution（1563KB） | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | View Download | |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment