CAS OpenIR  > 中科院上海应用物理研究所2011-2018年
Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses
Jiang, H; He, Y; He, YM; Li, AG; Wang, H; Zheng, Y; Dong, ZH; Jiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
2015
Source PublicationJOURNAL OF SYNCHROTRON RADIATION
ISSN1600-5775
Volume22Pages:1379—1385
Subtype期刊文献
AbstractRu/C multilayer monochromators with different periodic thicknesses were investigated using X-ray grazing-incidence reflectivity, diffuse scattering, Bragg imaging, morphology testing, etc. before and after cryogenic cooling. Quantitative analyses enabled the determination of the key multilayer structural parameters for samples with different periodic thicknesses, especially the influence from the ruthenium crystallization. The results also reveal that the basic structures and reflection performance keep stable after cryogenic cooling. The low-temperature treatment smoothed the surfaces and interfaces and changed the growth characteristic to a low-frequency surface figure. This study helps with the understanding of the structure evolution of multilayer monochromators during cryogenic cooling and presents sufficient experimental proof for using cryogenically cooled multilayer monochromators in a high-thermal-load undulator beamline.
KeywordCoherent Synchrotron-radiation X-ray Total-reflection Scattering Optics
Language英语
WOS IDWOS:000364422100008
Citation statistics
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/25050
Collection中科院上海应用物理研究所2011-2018年
Corresponding AuthorJiang, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
Recommended Citation
GB/T 7714
Jiang, H,He, Y,He, YM,et al. Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses[J]. JOURNAL OF SYNCHROTRON RADIATION,2015,22:1379—1385.
APA Jiang, H.,He, Y.,He, YM.,Li, AG.,Wang, H.,...&Jiang, H .(2015).Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses.JOURNAL OF SYNCHROTRON RADIATION,22,1379—1385.
MLA Jiang, H,et al."Structural characterization and low-temperature properties of Ru/C multilayer monochromators with different periodic thicknesses".JOURNAL OF SYNCHROTRON RADIATION 22(2015):1379—1385.
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