CAS OpenIR  > 中科院上海应用物理研究所2011-2018年
Development of XUV multilayer gratings with high resolution and high efficiency
Yang, XW; Huang, QS; Kozhevnikov, IV; Wang, ZS; Zhao, J; Wu, YQ; Yang, XW (reprint author), Tongji Univ, Sch Phys Sci & Engn, Inst Precis Opt Engn, MOE Key Lab Adv Micro Struct Mat, Shanghai 200092, Peoples R China.
2015
Conference NameConference on EUV and X-ray Optics - Synergy between Laboratory and Space IV
Conference DateAPR 13-14, 2015
Conference PlacePrague, CZECH REPUBLIC
AbstractWe present a short review of our activities carried out in Tongji University (Shanghai, China) in the field of theory and technology of soft X-ray multilayer diffraction gratings. Diffraction gratings are widely used to study the structure and dynamics of a matter in laboratory and space by spectral analysis techniques. Combining multilayer and grating structures into a single unit allows to increase essentially both the spectral resolution and the efficiency of the diffraction optics. The unified analytical theory of soft X-ray diffraction from multilayer gratings operating in the single-order regime is briefly discussed. The single-order regime occurs when incident wave excites the only diffraction order and it is characterized by ultimately high diffraction efficiency tending to the reflectivity of conventional multilayer mirror. Our first experiments in fabrication of the blazed multilayer gratings by anisotropic etching of a silicon crystal with small roughness of the facet surfaces are described.
ISSN0277-786X
ISBN978-1-62841-631-2
Subtype会议文献
KeywordDiffraction Efficiency Enhancement Wavelength Operation
Indexed BySCI
Language英语
Document Type会议论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/25101
Collection中科院上海应用物理研究所2011-2018年
Corresponding AuthorYang, XW (reprint author), Tongji Univ, Sch Phys Sci & Engn, Inst Precis Opt Engn, MOE Key Lab Adv Micro Struct Mat, Shanghai 200092, Peoples R China.
Recommended Citation
GB/T 7714
Yang, XW,Huang, QS,Kozhevnikov, IV,et al. Development of XUV multilayer gratings with high resolution and high efficiency[C],2015.
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