Study of Scintillator thickness optimization of lens-coupled X-ray imaging detectors
Xie, H; Du, G; Deng, B; Chen, R; Xiao, T; Xie, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
2016
发表期刊JOURNAL OF INSTRUMENTATION
ISSN1748-0221
卷号11期号:-页码:
文章类型期刊文献
摘要Lens-coupled X-ray in-direct imaging detectors are very popular for high-resolution X-ray imaging at the third generation synchrotron radiation facilities. This imaging system consists of a scintilator producing a visible-light image of X-ray beam, a microscope objective, a mirror reflecting at 90 degrees and a CCD camera. When the thickness of the scintillator is matched with the numerical aperture (NA) of the microscope objective, the image quality of experimental results will be improved obviously. This paper used an imaging system at BL13W beamline of Shanghai Synchrotron Radiation Facility (SSRF) to study the matching relation between the scintillator thickness and the NA of the microscope objective with a real sample. By use of the matching relation between the scintillator thickness and the NA of the microscope objective, the optimal imaging results have been obtained.
关键词Computed Microtomography Resolution
DOI10.1088/1748-0221/11/03/C03057
收录类别SCI
语种英语
WOS记录号WOS:000375746200058
引用统计
文献类型期刊论文
条目标识符http://ir.sinap.ac.cn/handle/331007/25850
专题中科院上海应用物理研究所2011-2018年
通讯作者Xie, H (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Zhangheng Rd 239, Shanghai 201204, Peoples R China.
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Xie, H,Du, G,Deng, B,et al. Study of Scintillator thickness optimization of lens-coupled X-ray imaging detectors[J]. JOURNAL OF INSTRUMENTATION,2016,11(-):—.
APA Xie, H,Du, G,Deng, B,Chen, R,Xiao, T,&Xie, H .(2016).Study of Scintillator thickness optimization of lens-coupled X-ray imaging detectors.JOURNAL OF INSTRUMENTATION,11(-),—.
MLA Xie, H,et al."Study of Scintillator thickness optimization of lens-coupled X-ray imaging detectors".JOURNAL OF INSTRUMENTATION 11.-(2016):—.
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