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题名: X-ray Microtomography at Shanghai Synchrotron Radiation Facility
作者: Chen, RC; Xie, HL; Deng, BA; Du, GH; Ren, YQ; Wang, YD; Zhou, GZ; Tan, H; Yang, YM; Xu, L; Hu, T; Li, Q; Feng, BG; Wang, FX; Xiao, TQ
出版日期: 2016
会议名称: Conference on Developments in X-Ray Tomography X
会议日期: AUG 29-31, 2016
会议地点: San Diego, CA
关键词: Synchrotron Radiation ; X-ray imaging ; tomography ; quantitative imaging
DOI: 10.1117/12.2238785
通讯作者: Xiao, TQ (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China.
收录类别: SCI
会议主办者: SPIE
ISSN: 0277-786X
ISBN: 978-1-5106-0325-7; 978-1-5106-0326-4
文章类型: 会议论文
语种: 英语
Citation statistics:
内容类型: 会议论文
URI标识: http://ir.sinap.ac.cn/handle/331007/26397
Appears in Collections:中科院上海应用物理研究所2011-2017年_会议论文

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