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Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation
Wang, JS; Jin, KJ; Guo, HZ; Gu, JX; Wan, Q; He, X; Li, XL; Xu, XL; Yang, GZ; Jin, KJ (reprint author), Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China.; Jin, KJ (reprint author), Univ Chinese Acad Sci, Beijing 100049, Peoples R China.; Jin, KJ (reprint author), Collaborat Innovat Ctr Quantum Matter, Beijing 100190, Peoples R China.
2016
Source PublicationSCIENTIFIC REPORTS
ISSN2045-2322
Volume6Pages:-
Subtype期刊论文
AbstractBiFeO3 thin films have drawn much attention due to its potential applications for novel magnetoelectric devices and fundamental physics in magnetoelectric coupling. However, the structural evolution of BiFeO3 films with thickness remains controversial. Here we use an optical second-harmonic generation technique to explore the phase-related symmetry evolution of BiFeO3 thin films with the variation of thickness. The crystalline structures for 60 and 180-nm-thick BiFeO3 thin films were characterized by high-resolution X-ray diffractometry reciprocal space mapping and the local piezoelectric response for 60-nm-thick BiFeO3 thin films was characterized by piezoresponse force microscopy. The present results show that the symmetry of BiFeO3 thin films with a thickness below 60 nm belongs to the point group 4 mm. We conclude that the disappearance of fourfold rotational symmetry in SHG s-out pattern implies for the appearance of R-phase. The fact that the thinner the film is, the closer to 1 the tensor element ratio chi(31)/chi(15) tends, indicates an increase of symmetry with the decrease of thickness for BiFeO3 thin films.
DOI10.1038/srep38268
Indexed BySCI
Language英语
WOS IDWOS:000388985800001
Citation statistics
Cited Times:8[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/26502
Collection中科院上海应用物理研究所2011-2018年
Corresponding AuthorJin, KJ (reprint author), Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China.; Jin, KJ (reprint author), Univ Chinese Acad Sci, Beijing 100049, Peoples R China.; Jin, KJ (reprint author), Collaborat Innovat Ctr Quantum Matter, Beijing 100190, Peoples R China.
Recommended Citation
GB/T 7714
Wang, JS,Jin, KJ,Guo, HZ,et al. Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation[J]. SCIENTIFIC REPORTS,2016,6:-.
APA Wang, JS.,Jin, KJ.,Guo, HZ.,Gu, JX.,Wan, Q.,...&Jin, KJ .(2016).Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation.SCIENTIFIC REPORTS,6,-.
MLA Wang, JS,et al."Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation".SCIENTIFIC REPORTS 6(2016):-.
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