Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation
Wang, JS; Jin, KJ; Guo, HZ; Gu, JX; Wan, Q; He, X; Li, XL; Xu, XL; Yang, GZ; Jin, KJ (reprint author), Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China.; Jin, KJ (reprint author), Univ Chinese Acad Sci, Beijing 100049, Peoples R China.; Jin, KJ (reprint author), Collaborat Innovat Ctr Quantum Matter, Beijing 100190, Peoples R China.
2016
发表期刊SCIENTIFIC REPORTS
ISSN2045-2322
卷号6页码:-
文章类型期刊论文
摘要BiFeO3 thin films have drawn much attention due to its potential applications for novel magnetoelectric devices and fundamental physics in magnetoelectric coupling. However, the structural evolution of BiFeO3 films with thickness remains controversial. Here we use an optical second-harmonic generation technique to explore the phase-related symmetry evolution of BiFeO3 thin films with the variation of thickness. The crystalline structures for 60 and 180-nm-thick BiFeO3 thin films were characterized by high-resolution X-ray diffractometry reciprocal space mapping and the local piezoelectric response for 60-nm-thick BiFeO3 thin films was characterized by piezoresponse force microscopy. The present results show that the symmetry of BiFeO3 thin films with a thickness below 60 nm belongs to the point group 4 mm. We conclude that the disappearance of fourfold rotational symmetry in SHG s-out pattern implies for the appearance of R-phase. The fact that the thinner the film is, the closer to 1 the tensor element ratio chi(31)/chi(15) tends, indicates an increase of symmetry with the decrease of thickness for BiFeO3 thin films.
DOI10.1038/srep38268
收录类别SCI
语种英语
WOS记录号WOS:000388985800001
引用统计
被引频次:7[WOS]   [WOS记录]     [WOS相关记录]
文献类型期刊论文
条目标识符http://ir.sinap.ac.cn/handle/331007/26502
专题中科院上海应用物理研究所2011-2018年
通讯作者Jin, KJ (reprint author), Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China.; Jin, KJ (reprint author), Univ Chinese Acad Sci, Beijing 100049, Peoples R China.; Jin, KJ (reprint author), Collaborat Innovat Ctr Quantum Matter, Beijing 100190, Peoples R China.
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Wang, JS,Jin, KJ,Guo, HZ,et al. Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation[J]. SCIENTIFIC REPORTS,2016,6:-.
APA Wang, JS.,Jin, KJ.,Guo, HZ.,Gu, JX.,Wan, Q.,...&Jin, KJ .(2016).Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation.SCIENTIFIC REPORTS,6,-.
MLA Wang, JS,et al."Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation".SCIENTIFIC REPORTS 6(2016):-.
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