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题名:
Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation
作者: Wang, JS; Jin, KJ; Guo, HZ; Gu, JX; Wan, Q; He, X; Li, XL; Xu, XL; Yang, GZ
刊名: SCIENTIFIC REPORTS
出版日期: 2016
卷号: 6, 页码:-
DOI: 10.1038/srep38268
通讯作者: Jin, KJ (reprint author), Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China. ; Jin, KJ (reprint author), Univ Chinese Acad Sci, Beijing 100049, Peoples R China. ; Jin, KJ (reprint author), Collaborat Innovat Ctr Quantum Matter, Beijing 100190, Peoples R China.
文章类型: 期刊论文
英文摘要: BiFeO3 thin films have drawn much attention due to its potential applications for novel magnetoelectric devices and fundamental physics in magnetoelectric coupling. However, the structural evolution of BiFeO3 films with thickness remains controversial. Here we use an optical second-harmonic generation technique to explore the phase-related symmetry evolution of BiFeO3 thin films with the variation of thickness. The crystalline structures for 60 and 180-nm-thick BiFeO3 thin films were characterized by high-resolution X-ray diffractometry reciprocal space mapping and the local piezoelectric response for 60-nm-thick BiFeO3 thin films was characterized by piezoresponse force microscopy. The present results show that the symmetry of BiFeO3 thin films with a thickness below 60 nm belongs to the point group 4 mm. We conclude that the disappearance of fourfold rotational symmetry in SHG s-out pattern implies for the appearance of R-phase. The fact that the thinner the film is, the closer to 1 the tensor element ratio chi(31)/chi(15) tends, indicates an increase of symmetry with the decrease of thickness for BiFeO3 thin films.
收录类别: SCI
语种: 英语
WOS记录号: WOS:000388985800001
ISSN号: 2045-2322
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.sinap.ac.cn/handle/331007/26502
Appears in Collections:中科院上海应用物理研究所2011-2017年_期刊论文

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Recommended Citation:
Wang, JS,Jin, KJ,Guo, HZ,et al. Evolution of structural distortion in BiFeO3 thin films probed by second-harmonic generation[J]. SCIENTIFIC REPORTS,2016-01-01,6:-.
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