CAS OpenIR  > 中科院上海应用物理研究所2011-2020年
Modal phase measuring deflectometry
Huang, L; Xue, JP; Gao, B; McPherson, C; Beverage, J; Idir, M; Huang, L (reprint author), Brookhaven Natl Lab, NSLS II, 50 Rutherford Dr, Upton, NY 11973 USA.
Source PublicationOPTICS EXPRESS
AbstractIn this work, a model based method is applied to phase measuring deflectometry, named modal phase measuring deflectometry. The height and slopes of the surface under test are represented by mathematical models and updated by optimizing the model coefficients to minimize the discrepancy between the reprojection in ray tracing and the actual measurement. The pose of the screen relative to the camera is pre-calibrated and further optimized together with the shape coefficients of the surface under test. Simulations and experiments are conducted to demonstrate the feasibility of the proposed approach. (C) 2016 Optical Society of America
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WOS IDWOS:000388399100090
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Document Type期刊论文
Corresponding AuthorHuang, L (reprint author), Brookhaven Natl Lab, NSLS II, 50 Rutherford Dr, Upton, NY 11973 USA.
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GB/T 7714
Huang, L,Xue, JP,Gao, B,et al. Modal phase measuring deflectometry[J]. OPTICS EXPRESS,2016,24(21):24649-24664.
APA Huang, L.,Xue, JP.,Gao, B.,McPherson, C.,Beverage, J.,...&Huang, L .(2016).Modal phase measuring deflectometry.OPTICS EXPRESS,24(21),24649-24664.
MLA Huang, L,et al."Modal phase measuring deflectometry".OPTICS EXPRESS 24.21(2016):24649-24664.
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