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CAS OpenIR  > 中科院上海应用物理研究所2011-2017年  > 期刊论文
题名:
Modal phase measuring deflectometry
作者: Huang, L; Xue, JP; Gao, B; McPherson, C; Beverage, J; Idir, M
刊名: OPTICS EXPRESS
出版日期: 2016
卷号: 24, 期号:21, 页码:24649-24664
DOI: 10.1364/OE.24.024649
通讯作者: Huang, L (reprint author), Brookhaven Natl Lab, NSLS II, 50 Rutherford Dr, Upton, NY 11973 USA.
文章类型: 期刊论文
英文摘要: In this work, a model based method is applied to phase measuring deflectometry, named modal phase measuring deflectometry. The height and slopes of the surface under test are represented by mathematical models and updated by optimizing the model coefficients to minimize the discrepancy between the reprojection in ray tracing and the actual measurement. The pose of the screen relative to the camera is pre-calibrated and further optimized together with the shape coefficients of the surface under test. Simulations and experiments are conducted to demonstrate the feasibility of the proposed approach. (C) 2016 Optical Society of America
收录类别: SCI
语种: 英语
WOS记录号: WOS:000388399100090
ISSN号: 1094-4087
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.sinap.ac.cn/handle/331007/26576
Appears in Collections:中科院上海应用物理研究所2011-2017年_期刊论文

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Recommended Citation:
Huang, L,Xue, JP,Gao, B,et al. Modal phase measuring deflectometry[J]. OPTICS EXPRESS,2016-01-01,24(21):24649-24664.
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