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题名: Preparation and Luminescence Properties of Lu2SiO5: Ce3+ Thin Film
作者: Wu, S; Liu, B; Chen, SW; Zhang, JN; Liu, XL; Gu, M; Huang, SM; Ni, C; Xue, CF
刊名: JOURNAL OF INORGANIC MATERIALS
出版日期: 2016
卷号: 31, 期号:9, 页码:948-954
关键词: Lu2SiO5: Ce3+ thin film ; H2O-Si ratio ; sintering process ; adhesive ; solid content ; luminescence properties
DOI: 10.15541/jim20160034
通讯作者: Wu, S (reprint author), Tongji Univ, Sch Phys Sci & Engn, Shanghai Key Lab Special Artificial Microstruct M, Shanghai 200092, Peoples R China.
文章类型: 期刊论文
英文摘要: Lu2SiO5: Ce3+ thin film is a promising material for X-ray detection due to its high light output, short decay time, high density, and high spatial resolution. In present work, Lu2SiO5: Ce3+ thin films were prepared by Sol-Gel method. The optimal experimental conditions were obtained concerning solid content, adhesive content, water content, and annealing progress. Under the conditions with air humidity of 85%, sol's H2O-Si ratio of 6.6, appropriate amount of PEG400, optimized solid content, and sintering starting from 450 degrees C, the thin films are prepared crack-free with high transparence and excellent luminescent properties. The thickness of its single layer is 167 nm. It is found that water content is the major factor that causes film foggy, and sintering progress affects the reaction of organics and crystallization. Furthermore, solid content and the adhesive content are the two factors controlling the film thickness. The present study may promote the application of Lu2SiO5: Ce3+ thin films in detection systems.
收录类别: SCI
语种: 中文
WOS记录号: WOS:000383397000008
ISSN号: 1000-324X
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.sinap.ac.cn/handle/331007/26600
Appears in Collections:中科院上海应用物理研究所2011-2017年_期刊论文

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