Wu, S (reprint author), Tongji Univ, Sch Phys Sci & Engn, Shanghai Key Lab Special Artificial Microstruct M, Shanghai 200092, Peoples R China.
文章类型:
期刊论文
英文摘要:
Lu2SiO5: Ce3+ thin film is a promising material for X-ray detection due to its high light output, short decay time, high density, and high spatial resolution. In present work, Lu2SiO5: Ce3+ thin films were prepared by Sol-Gel method. The optimal experimental conditions were obtained concerning solid content, adhesive content, water content, and annealing progress. Under the conditions with air humidity of 85%, sol's H2O-Si ratio of 6.6, appropriate amount of PEG400, optimized solid content, and sintering starting from 450 degrees C, the thin films are prepared crack-free with high transparence and excellent luminescent properties. The thickness of its single layer is 167 nm. It is found that water content is the major factor that causes film foggy, and sintering progress affects the reaction of organics and crystallization. Furthermore, solid content and the adhesive content are the two factors controlling the film thickness. The present study may promote the application of Lu2SiO5: Ce3+ thin films in detection systems.
