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Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing
Yu, C; Aoun, B; Cui, LS; Liu, YN; Yang, H; Jiang, XH; Cai, S; Jiang, DQ; Liu, ZP; Brown, DE; Ren, Y; Cui, LS (reprint author), China Univ Petr, State Key Lab Heavy Oil Proc, Beijing 102249, Peoples R China.; Cui, LS (reprint author), China Univ Petr, Dept Mat Sci & Engn, Beijing 102249, Peoples R China.; Liu, YN (reprint author), Univ Western Australia, Sch Mech & Chem Engn, Crawley, WA 6009, Australia.
2016
Source PublicationACTA MATERIALIA
ISSN1359-6454
Volume115Pages:35-44
Subtype期刊论文
AbstractMicrostructure evolution of a cold-drawn NiTi shape memory alloy wire was investigated by means of in situ synchrotron high-energy X-ray diffraction during continuous heating. The cold-drawn wire contained amorphous regions and nano-crystalline domains in its microstructure. Pair distribution function analysis revealed that the amorphous regions underwent structural relaxation via atomic rearrangement when heated above 100 degrees C. The nano-crystalline domains were found to exhibit a strong cold work induced lattice strain anisotropy along 111 , which coincides with the crystallographic fiber orientation of the domains along the wire axial direction. The lattice strain anisotropy systematically decreased upon heating above 200 degrees C, implying a structural recovery. Crystallization of the amorphous phase led to a broadening of the angular distribution of 111 preferential orientations of grains along the axial direction as relative to the original 111 axial fiber texture of the nanocrystalline domains produced by the severe cold wire drawing deformation. (C) 2016 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
KeywordShape Memory Alloy Structural Relaxation Crystallization In-situ Synchrotron High Energy x Ray Diffraction
DOI10.1016/j.actamat.2016.05.039
Indexed BySCI
Language英语
WOS IDWOS:000380083400004
Citation statistics
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/26644
Collection中科院上海应用物理研究所2011-2018年
Corresponding AuthorCui, LS (reprint author), China Univ Petr, State Key Lab Heavy Oil Proc, Beijing 102249, Peoples R China.; Cui, LS (reprint author), China Univ Petr, Dept Mat Sci & Engn, Beijing 102249, Peoples R China.; Liu, YN (reprint author), Univ Western Australia, Sch Mech & Chem Engn, Crawley, WA 6009, Australia.
Recommended Citation
GB/T 7714
Yu, C,Aoun, B,Cui, LS,et al. Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing[J]. ACTA MATERIALIA,2016,115:35-44.
APA Yu, C.,Aoun, B.,Cui, LS.,Liu, YN.,Yang, H.,...&Liu, YN .(2016).Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing.ACTA MATERIALIA,115,35-44.
MLA Yu, C,et al."Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing".ACTA MATERIALIA 115(2016):35-44.
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