CAS OpenIR  > 中科院上海应用物理研究所2011-2020年
Background noise removal in x-ray ptychography
Wang, CP; Xu, ZJ; Liu, HG; Wang, Y; Wang, J; Tai, RZ
Source PublicationAPPLIED OPTICS
AbstractPtychography is a diffraction-based x-ray microscopy method that removes the resolution limit imposed by image-forming optical elements. However, background noise in the recorded diffraction patterns will degrade the reconstructed images and may cause reconstruction failure. Removal of the background noise from a ptychography dataset is an important but rather ambiguous prereconstruction data processing step because high-spatial-frequency diffraction signals are inevitably partly wiped out along with the noise. In this paper, several newly designed techniques for removing background noise from experimental ptychographic datasets are provided. Meanwhile, effects of residual background noise and high-frequency signal loss on reconstructed image quality are discussed in detail. The image quality is assessed quantitatively by the power spectral density analysis method and spatial resolution calculation. Both the simulated and experimental results indicate that the positive effect of noise removal by these methods clearly exceeds the negative effect of the accompanied high-spatial-frequency signal loss because part of the lost signals can be recovered by the improved consistencies between neighboring diffraction patterns by the noise removal. (C) 2017 Optical Society of America
Indexed BySCI
WOS IDWOS:000396227500010
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Cited Times:12[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
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GB/T 7714
Wang, CP,Xu, ZJ,Liu, HG,et al. Background noise removal in x-ray ptychography[J]. APPLIED OPTICS,2017,56(8):2099-2111.
APA Wang, CP,Xu, ZJ,Liu, HG,Wang, Y,Wang, J,&Tai, RZ.(2017).Background noise removal in x-ray ptychography.APPLIED OPTICS,56(8),2099-2111.
MLA Wang, CP,et al."Background noise removal in x-ray ptychography".APPLIED OPTICS 56.8(2017):2099-2111.
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