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题名:
Lattice damage assessment and optical waveguide properties in LaAlO3 single crystal irradiated with swift Si ions
作者: Liu, Y; Crespillo, ML; Huang, Q; Wang, TJ; Liu, P; Wang, XL
刊名: JOURNAL OF PHYSICS D-APPLIED PHYSICS
出版日期: 2017
卷号: 50, 期号:5, 页码:-
关键词: swift ion irradiation ; damage assessment ; waveguide properties ; lanthanum aluminate crystal
DOI: 10.1088/1361-6463/aa5063
文章类型: 期刊论文
英文摘要: As one of the representative ABO(3) perovskite-structured oxides, lanthanum aluminate (LaAlO3) crystal has emerged as one of the most valuable functional-materials, and has attracted plenty of fundamental research and promising applications in recent years. Electronic, magnetic, optical and other properties of LaAlO3 strongly depend on its crystal structure, which could be strongly modified owing to the nuclear or electronic energy loss deposited in an ion irradiation environment and, therefore, significantly affecting the performance of LaAlO3-based devices. In this work, utilizing swift (tens of MeV) Si-ion irradiation, the damage behavior of LaAlO3 crystal induced by nuclear or electronic energy loss has been studied in detail utilizing complementary characterization techniques. Differing from other perovskite-structured crystals in which the electronic energy loss could lead to the formation of an amorphous region based on the thermal spike mechanism, in this case, intense electronic energy loss in LaAlO3 will not induce any obvious structural damage. The effects of ion irradiation on the mechanical properties, including hardness increase and elastic modulus decrease, have been confirmed. On the other hand, considering the potential applications of LaAlO3 in the field of integrated optoelectronics, the optical-waveguide properties of the irradiation region have been studied. The significant correspondence (symmetrical inversion) between the iWKB-reconstructed refractive-index profile and SRIM-simulated dpa profile further proves the effects (irradiation-damage production and refractive-index decrease) of nuclear energy loss during the swift-ion penetration process in LaAlO3 crystal. In the case of the rather-thick damage layer produced by swift-ion irradiation, obtaining a damage profile will be constrained owing to the analysis-depth limitation of the characterization techniques (RBS/channeling), and our analysis process (optical guided-mode measurement and subsequent refractive-index-profile reconstruction) also provides a new approach to study the damage behavior (damage profile) once the functional relationship between the refractive index and lattice disorder for the specific material could be determined.
收录类别: SCI
语种: 英语
WOS记录号: WOS:000392394000003
ISSN号: 0022-3727
Citation statistics:
内容类型: 期刊论文
URI标识: http://ir.sinap.ac.cn/handle/331007/27365
Appears in Collections:中科院上海应用物理研究所2011-2017年_期刊论文

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Recommended Citation:
Liu, Y,Crespillo, ML,Huang, Q,et al. Lattice damage assessment and optical waveguide properties in LaAlO3 single crystal irradiated with swift Si ions[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2017-01-01,50(5):-.
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