CAS OpenIR  > 中科院上海应用物理研究所2011-2018年
Humidity effects on scanning polarization force microscopy imaging
Shen, Y; Zhou, Y; Sun, YX; Zhang, LJ; Wang, Y; Hu, J; Zhang, Y
2017
Source PublicationAPPLIED SURFACE SCIENCE
ISSN0169-4332
Volume412Issue:-Pages:497-504
Subtype期刊论文
AbstractScanning polarization force microscopy (SPFM) is a useful surface characterization technique to visually characterize and distinguish nanomaterial with different local dielectric properties at nanometer scale. In this paper, taking the individual one-atom-thick graphene oxide (GO) and reduced graphene oxide (rGO) sheets on mica as examples, we described the influences of environmental humidity on SPFM imaging. We found that the apparent heights (AHs) or contrast of SPFM imaging was influenced significantly by relative humidity (RH) at a response time of a few seconds. And this influence rooted in the sensitive dielectric constant of mica surface to the RH change. While dielectric properties of GO and rGO sheets were almost immune to the humidity change. In addition, we gave the method to determine the critical humidity at which the contrast conversion happened under different conditions. And this is important to the contrast control and repeatable imaging of SPFM through RH adjusting. These findings suggest a strategy of controllable and repeatable imaging the local dielectric properties of nanomaterials with SPFM, which is critically important for further distinguishment, manipulation, electronic applications, etc. (C) 2017 Elsevier B.V. All rights reserved.
KeywordReduced Graphene Oxide Wetting Properties Carbon Nanotubes Graphite Oxide Mica Water Reduction Condensation Glycerol Sheets
DOI10.1016/j.apsusc.2017.03.291
WOS KeywordREDUCED GRAPHENE OXIDE ; WETTING PROPERTIES ; CARBON NANOTUBES ; GRAPHITE OXIDE ; MICA ; WATER ; REDUCTION ; CONDENSATION ; GLYCEROL ; SHEETS
Indexed BySCI
Language英语
WOS IDWOS:000401392900056
Citation statistics
Cited Times:3[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/28681
Collection中科院上海应用物理研究所2011-2018年
Recommended Citation
GB/T 7714
Shen, Y,Zhou, Y,Sun, YX,et al. Humidity effects on scanning polarization force microscopy imaging[J]. APPLIED SURFACE SCIENCE,2017,412(-):497-504.
APA Shen, Y.,Zhou, Y.,Sun, YX.,Zhang, LJ.,Wang, Y.,...&Zhang, Y.(2017).Humidity effects on scanning polarization force microscopy imaging.APPLIED SURFACE SCIENCE,412(-),497-504.
MLA Shen, Y,et al."Humidity effects on scanning polarization force microscopy imaging".APPLIED SURFACE SCIENCE 412.-(2017):497-504.
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