CAS OpenIR  > 中科院上海应用物理研究所2011-2018年
Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods
Zhang, L; Song, SN; Xi, W; Li, L; Song, ZT
2018
Source PublicationJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
ISSN0957-4522
Volume29Issue:6Pages:4704-4710
Subtype期刊论文
AbstractInfluence of Ti additions in Sb2Te3 thin films on structure and phase stability was studied by experiments together with theoretical calculations. The incorporation of Ti atoms in the Sb2Te3 thin films caused formation of finer grains. By X-ray photoelectron spectroscopy and ab initio calculation, both the Sb and Te atoms are likely to be replaced by the Ti atoms to form Ti-Sb and Ti-Te covalent bonds. It suggests that the Ti atoms locate in Te1 position and interstice of the lattice.
KeywordCrystallization Behavior Raman-scattering
DOI10.1007/s10854-017-8422-0
Indexed BySCI
Language英语
WOS IDWOS:000425763100038
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/28983
Collection中科院上海应用物理研究所2011-2018年
Affiliation1.Zhang, L
2.Song, SN
3.Xi, W
4.Li, L
5.Song, ZT
Recommended Citation
GB/T 7714
Zhang, L,Song, SN,Xi, W,et al. Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2018,29(6):4704-4710.
APA Zhang, L,Song, SN,Xi, W,Li, L,&Song, ZT.(2018).Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,29(6),4704-4710.
MLA Zhang, L,et al."Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 29.6(2018):4704-4710.
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