Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods
Zhang, L; Song, SN; Xi, W; Li, L; Song, ZT
2018
发表期刊JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
ISSN0957-4522
卷号29期号:6页码:4704-4710
文章类型期刊论文
摘要Influence of Ti additions in Sb2Te3 thin films on structure and phase stability was studied by experiments together with theoretical calculations. The incorporation of Ti atoms in the Sb2Te3 thin films caused formation of finer grains. By X-ray photoelectron spectroscopy and ab initio calculation, both the Sb and Te atoms are likely to be replaced by the Ti atoms to form Ti-Sb and Ti-Te covalent bonds. It suggests that the Ti atoms locate in Te1 position and interstice of the lattice.
关键词Crystallization Behavior Raman-scattering
DOI10.1007/s10854-017-8422-0
收录类别SCI
语种英语
WOS记录号WOS:000425763100038
引用统计
文献类型期刊论文
条目标识符http://ir.sinap.ac.cn/handle/331007/28983
专题中科院上海应用物理研究所2011-2018年
作者单位1.Zhang, L
2.Song, SN
3.Xi, W
4.Li, L
5.Song, ZT
推荐引用方式
GB/T 7714
Zhang, L,Song, SN,Xi, W,et al. Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2018,29(6):4704-4710.
APA Zhang, L,Song, SN,Xi, W,Li, L,&Song, ZT.(2018).Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,29(6),4704-4710.
MLA Zhang, L,et al."Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 29.6(2018):4704-4710.
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