CAS OpenIR  > 中科院上海应用物理研究所2011-2020年
Manipulating the Structural and Electronic Properties of Epitaxial SrCoO2.5 Thin Films by Tuning the Epitaxial Strain
Zhao, JL; Guo, HZ; He, X; Zhang, QH; Gu, L; Li, XL; Jin, KJ; Yang, TY; Ge, C; Luo, Y; He, M; Long, YW; Wang, JO; Qian, HJ; Wang, C; Lu, HB; Yang, GZ; Ibrahim, K
2018
Source PublicationACS APPLIED MATERIALS & INTERFACES
ISSN1944-8244
Volume10Issue:12Pages:10211-10219
Subtype期刊论文
AbstractStructure determines material's functionality, and strain tunes the structure. Tuning the coherent epitaxial strain by varying the thickness of the films is a precise route to manipulate the functional properties in the low-dimensional oxide materials. Here, to explore the effects of the coherent epitaxial strain on the properties of SrCoO2.5 thin films, thickness-dependent evolutions of the structural properties and electronic structures were investigated by X-ray diffraction, Raman-spectra, optical absorption spectra, scanning transmission electron microscopy (STEM), and first principles calculations. By increasing the thickness of the SrCoO2.5 films, the c-axis lattice constant decreases, indicating the relaxation of the coherent epitaxial strain. The energy band gap increases and the Raman spectra undergo a substantial softening with the relaxation of the coherent epitaxial strain. From the STEM results, it can be concluded that the strain causes the variation of the oxygen content in the BM-SCO2.5 films, which results in the variation of band gaps with varying the strain. First-principles calculations show that strain-induced changes in bond lengths and angles of the octahedral CoO6 and tetrahedral CoO4 cannot explain the variation band gap. Our findings offer an alternative strategy to manipulate structural and electronic properties by tuning the coherent epitaxial strain in transition-metal oxide thin films.
KeywordOxide Fuel-cells Transition-metal Oxides Phase-transformation Oxygen Vacancies Perovskite Cathode Srcoo3-delta Diffraction Co3o4
DOI10.1021/acsami.8b00791
Indexed BySCI
Language英语
WOS IDWOS:000428972700037
Citation statistics
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/29066
Collection中科院上海应用物理研究所2011-2020年
Affiliation1.Zhao, JL
2.Guo, HZ
3.He, X
4.Zhang, QH
5.Gu, L
6.Li, XL
7.Jin, KJ
8.Yang, TY
9.Ge, C
10.Luo, Y
11.He, M
12.Long, YW
13.Wang, JO
14.Qian, HJ
15.Wang, C
16.Lu, HB
17.Yang, GZ
18.Ibrahim, K
Recommended Citation
GB/T 7714
Zhao, JL,Guo, HZ,He, X,et al. Manipulating the Structural and Electronic Properties of Epitaxial SrCoO2.5 Thin Films by Tuning the Epitaxial Strain[J]. ACS APPLIED MATERIALS & INTERFACES,2018,10(12):10211-10219.
APA Zhao, JL.,Guo, HZ.,He, X.,Zhang, QH.,Gu, L.,...&Ibrahim, K.(2018).Manipulating the Structural and Electronic Properties of Epitaxial SrCoO2.5 Thin Films by Tuning the Epitaxial Strain.ACS APPLIED MATERIALS & INTERFACES,10(12),10211-10219.
MLA Zhao, JL,et al."Manipulating the Structural and Electronic Properties of Epitaxial SrCoO2.5 Thin Films by Tuning the Epitaxial Strain".ACS APPLIED MATERIALS & INTERFACES 10.12(2018):10211-10219.
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