CAS OpenIR  > 中科院上海应用物理研究所2011-2018年
Nanoscale mapping of dielectric properties based on surface adhesion force measurements
Wang, Y; Shen, Y; Wang, XY; Shen, ZW; Li, B; Hui, J; Zhang, Y
2018
Source PublicationBEILSTEIN JOURNAL OF NANOTECHNOLOGY
ISSN2190-4286
Volume9Pages:900-906
Subtype期刊论文
AbstractThe detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices.
KeywordScanning Probe Microscopy Graphene Oxide Sheets Large Energy Density Polymer Nanocomposites Graphite Oxide Composites Constant Membranes Films
DOI10.3762/bjnano.9.84
Indexed BySCI
Language英语
WOS IDWOS:000428094400001
Citation statistics
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/29082
Collection中科院上海应用物理研究所2011-2018年
Affiliation1.Wang, Y
2.Shen, Y
3.Wang, XY
4.Shen, ZW
5.Li, B
6.Hui, J
7.Zhang, Y
Recommended Citation
GB/T 7714
Wang, Y,Shen, Y,Wang, XY,et al. Nanoscale mapping of dielectric properties based on surface adhesion force measurements[J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY,2018,9:900-906.
APA Wang, Y.,Shen, Y.,Wang, XY.,Shen, ZW.,Li, B.,...&Zhang, Y.(2018).Nanoscale mapping of dielectric properties based on surface adhesion force measurements.BEILSTEIN JOURNAL OF NANOTECHNOLOGY,9,900-906.
MLA Wang, Y,et al."Nanoscale mapping of dielectric properties based on surface adhesion force measurements".BEILSTEIN JOURNAL OF NANOTECHNOLOGY 9(2018):900-906.
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