Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Nanoscale mapping of dielectric properties based on surface adhesion force measurements | |
| Wang, Y; Shen, Y; Wang, XY; Shen, ZW; Li, B; Hui, J; Zhang, Y | |
| 2018 | |
| Source Publication | BEILSTEIN JOURNAL OF NANOTECHNOLOGY
 |
| ISSN | 2190-4286 |
| Volume | 9Pages:900-906 |
| Subtype | 期刊论文 |
| Abstract | The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices. |
| Keyword | Scanning Probe Microscopy Graphene Oxide Sheets Large Energy Density Polymer Nanocomposites Graphite Oxide Composites Constant Membranes Films |
| DOI | 10.3762/bjnano.9.84 |
| Indexed By | SCI |
| Language | 英语 |
| WOS ID | WOS:000428094400001 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/29082 |
| Collection | 中科院上海应用物理研究所2011-2018年 |
| Affiliation | 1.Wang, Y 2.Shen, Y 3.Wang, XY 4.Shen, ZW 5.Li, B 6.Hui, J 7.Zhang, Y |
| Recommended Citation GB/T 7714 | Wang, Y,Shen, Y,Wang, XY,et al. Nanoscale mapping of dielectric properties based on surface adhesion force measurements[J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY,2018,9:900-906. |
| APA | Wang, Y.,Shen, Y.,Wang, XY.,Shen, ZW.,Li, B.,...&Zhang, Y.(2018).Nanoscale mapping of dielectric properties based on surface adhesion force measurements.BEILSTEIN JOURNAL OF NANOTECHNOLOGY,9,900-906. |
| MLA | Wang, Y,et al."Nanoscale mapping of dielectric properties based on surface adhesion force measurements".BEILSTEIN JOURNAL OF NANOTECHNOLOGY 9(2018):900-906. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Nanoscale mapping of（2994KB） | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | View Application Full Text | |
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