Nanoscale mapping of dielectric properties based on surface adhesion force measurements

doi:10.3762/bjnano.9.84

CAS OpenIR > 中科院上海应用物理研究所2011-2018年

	Nanoscale mapping of dielectric properties based on surface adhesion force measurements
	Wang, Y ; Shen, Y ; Wang, XY ; Shen, ZW ; Li, B ; Hui, J ; Zhang, Y
	2018
发表期刊	BEILSTEIN JOURNAL OF NANOTECHNOLOGY
ISSN	2190-4286
卷号	9 页码:900-906
文章类型	期刊论文
摘要	The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices.
关键词	Scanning Probe Microscopy Graphene Oxide Sheets Large Energy Density Polymer Nanocomposites Graphite Oxide Composites Constant Membranes Films
DOI	10.3762/bjnano.9.84
收录类别	SCI
语种	英语
WOS记录号	WOS:000428094400001
引用统计
文献类型	期刊论文
条目标识符	http://ir.sinap.ac.cn/handle/331007/29082
专题	中科院上海应用物理研究所2011-2018年
作者单位	1.Wang, Y 2.Shen, Y 3.Wang, XY 4.Shen, ZW 5.Li, B 6.Hui, J 7.Zhang, Y
推荐引用方式 GB/T 7714	Wang, Y,Shen, Y,Wang, XY,et al. Nanoscale mapping of dielectric properties based on surface adhesion force measurements[J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY,2018,9:900-906.
APA	Wang, Y.,Shen, Y.,Wang, XY.,Shen, ZW.,Li, B.,...&Zhang, Y.(2018).Nanoscale mapping of dielectric properties based on surface adhesion force measurements.BEILSTEIN JOURNAL OF NANOTECHNOLOGY,9,900-906.
MLA	Wang, Y,et al."Nanoscale mapping of dielectric properties based on surface adhesion force measurements".BEILSTEIN JOURNAL OF NANOTECHNOLOGY 9(2018):900-906.

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