Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Structural and Optical Properties of Ti-Doped InTe Thin Films | |
| Yuan, YF; Liu, CM; Su, J; Cheng, L; Fang, J; Zhang, XT; Sun, Y; Wu, YQ; Zhang, H; Li, J | |
| 2018 | |
| Source Publication | JOURNAL OF PHYSICAL CHEMISTRY C
 |
| ISSN | 1932-7447 |
| Volume | 122Issue:11Pages:6267-6272 |
| Subtype | 期刊论文 |
| Abstract | Thin films of Ti-doped indium telluride (InTe) chalcogenide were prepared by the magnetron co-sputtering method. The optical and structural properties were investigated by various tools after the thermal treatment. All annealed films were highly polycrystalline with (211) as the preferred orientation. Raman spectra results confirm that the structure of the InTe films can be adjusted by Ti dopants. The transmittance is high in the near-infrared region. The refractive index (n) and extinction coefficient (k) of the films were measured by a Spectroscopic Ellipsometer. The optical band gaps increase from 1.56 to 1.85 eV with the increasing concentration of Ti. The third-order nonlinear optical properties of the thin films were investigated by applying the open-aperture Z-scan method with femtosecond laser excitation at 800 nm wavelength. The results show reverse saturation absorptions which show the potential value of the films in optical limiting applications. The nonlinear absorption coefficient was calculated using a model developed by Sheik-Behae. The femtosecond pump probe technique was employed to measure the transient reflectivity of the samples. The results indicate that the lifetime of the carrier can be adjusted by the Ti dopant because of the carrier trapping effect. |
| Keyword | Chalcogenide Glasses Electrical-properties Nonlinearity Absorption Dependence |
| DOI | 10.1021/acs.jpcc.7b10862 |
| Indexed By | SCI |
| Language | 英语 |
| WOS ID | WOS:000428356700048 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/29142 |
| Collection | 中科院上海应用物理研究所2011-2018年 |
| Affiliation | 1.Yuan, YF 2.Liu, CM 3.Su, J 4.Cheng, L 5.Fang, J 6.Zhang, XT 7.Sun, Y 8.Wu, YQ 9.Zhang, H 10.Li, J |
| Recommended Citation GB/T 7714 | Yuan, YF,Liu, CM,Su, J,et al. Structural and Optical Properties of Ti-Doped InTe Thin Films[J]. JOURNAL OF PHYSICAL CHEMISTRY C,2018,122(11):6267-6272. |
| APA | Yuan, YF.,Liu, CM.,Su, J.,Cheng, L.,Fang, J.,...&Li, J.(2018).Structural and Optical Properties of Ti-Doped InTe Thin Films.JOURNAL OF PHYSICAL CHEMISTRY C,122(11),6267-6272. |
| MLA | Yuan, YF,et al."Structural and Optical Properties of Ti-Doped InTe Thin Films".JOURNAL OF PHYSICAL CHEMISTRY C 122.11(2018):6267-6272. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Structural and Optic（2168KB） | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | View Application Full Text | |
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