Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers | |
| Jiang, H; Wang, H; Zhu, JT; Xue, CF; Zhang, JY; Tian, NX; Li, AG | |
| 2018 | |
| Source Publication | JOURNAL OF SYNCHROTRON RADIATION
 |
| ISSN | 1600-5775 |
| Volume | 25Pages:785-792 |
| Subtype | 期刊论文 |
| Abstract | The interior structure, morphology and ligand surrounding of a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers are determined by various hard X-ray techniques in order to reveal the growth characteristics of Cr-based thin films. A Cr monolayer presents a three-stage growth mode with sudden changes occurring at a layer thickness of similar to 2 nm and beyond 6 nm. Cr-based multilayers are proven to have denser structures due to interfacial diffusion and layer growth mode. Cr/C and Cr/Sc multilayers have different interfacial widths resulting from asymmetry, degree of crystallinity and thermal stability. Cr/Sc multilayers present similar ligand surroundings to Cr foil, whereas Cr/C multilayers are similar to Cr monolayers. The aim of this study is to help understand the structural evolution regulation versus layer thickness and to improve the deposition technology of Cr-based thin films, in particular for obtaining stable Cr-based multilayers with ultra-short periods. |
| Keyword | Nitride Thin-films X-ray Mirrors Surface-morphology Optical-surfaces Growth Roughness Layer Microstructure Reflectivity Spectroscopy |
| DOI | 10.1107/S1600577518005143 |
| Indexed By | SCI |
| Language | 英语 |
| WOS ID | WOS:000431150000016 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/29188 |
| Collection | 中科院上海应用物理研究所2011-2019年 |
| Affiliation | 1.Jiang, H 2.Wang, H 3.Zhu, JT 4.Xue, CF 5.Zhang, JY 6.Tian, NX 7.Li, AG |
| Recommended Citation GB/T 7714 | Jiang, H,Wang, H,Zhu, JT,et al. Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers[J]. JOURNAL OF SYNCHROTRON RADIATION,2018,25:785-792. |
| APA | Jiang, H.,Wang, H.,Zhu, JT.,Xue, CF.,Zhang, JY.,...&Li, AG.(2018).Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers.JOURNAL OF SYNCHROTRON RADIATION,25,785-792. |
| MLA | Jiang, H,et al."Thickness-dependent structural characteristics for a sputtering-deposited chromium monolayer and Cr/C and Cr/Sc multilayers".JOURNAL OF SYNCHROTRON RADIATION 25(2018):785-792. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Thickness-dependent （1482KB） | 期刊论文 | 作者接受稿 | 开放获取 | CC BY-NC-SA | View Application Full Text | |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment