CAS OpenIR  > 中科院上海应用物理研究所2011-2019年
Resolving 500 nm axial separation by multi-slice X-ray ptychography
Huang, XJ; Yan, HF; He, Y; Ge, MY; Ozturk, H; Fang, YLL; Ha, S; Lin, MF; Lu, M; Nazaretski, E; Robinson, IK; Chu, YS
2019
Source PublicationACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES
ISSN2053-2733
Volume75Issue:-Pages:336—341
Subtype期刊论文
AbstractMulti-slice X-ray ptychography offers an approach to achieve images with a nanometre-scale resolution from samples with thicknesses larger than the depth of field of the imaging system by modeling a thick sample as a set of thin slices and accounting for the wavefront propagation effects within the specimen. Here, we present an experimental demonstration that resolves two layers of nanostructures separated by 500 nm along the axial direction, with sub-10 nm and sub-20 nm resolutions on two layers, respectively. Fluorescence maps are simultaneously measured in the multi-modality imaging scheme to assist in decoupling the mixture of low-spatial-frequency features across different slices. The enhanced axial sectioning capability using correlative signals obtained from multi-modality measurements demonstrates the great potential of the multi-slice ptychography method for investigating specimens with extended dimensions in 3D with high resolution.
KeywordHIGH-RESOLUTION MICROSCOPY CRYSTALLOGRAPHY OPTIMIZATION FLUORESCENCE SCATTERING DEPTH
DOI10.1107/S2053273318017229
Indexed BySCI
Language英语
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/31799
Collection中科院上海应用物理研究所2011-2019年
Affiliation1.Brookhaven Natl Lab, Natl Synchrotron Light Source 2, Upton, NY 11973 USA;
2.Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China;
3.Ozyegin Univ, Dept Mech Engn, TR-34794 Istanbul, Turkey;
4.Brookhaven Natl Lab, Computat Sci Initiat, Upton, NY 11973 USA;
5.Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA;
6.Brookhaven Natl Lab, Condensed Matter Phys & Mat Dept, Upton, NY 11973 USA;
7.UCL, London Ctr Nanotechnol, London WC1H 0AH, England
Recommended Citation
GB/T 7714
Huang, XJ,Yan, HF,He, Y,et al. Resolving 500 nm axial separation by multi-slice X-ray ptychography[J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,2019,75(-):336—341.
APA Huang, XJ.,Yan, HF.,He, Y.,Ge, MY.,Ozturk, H.,...&Chu, YS.(2019).Resolving 500 nm axial separation by multi-slice X-ray ptychography.ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES,75(-),336—341.
MLA Huang, XJ,et al."Resolving 500 nm axial separation by multi-slice X-ray ptychography".ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES 75.-(2019):336—341.
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