Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Application of quantitative imaging to elimination of scattering effect on X-ray in-line outline imaging | |
| Liu, LX（刘丽想）; Du, GH（杜国浩）; Hu, W（胡雯）; Luo, YY（骆玉宇）; Xie, HL（谢红兰）; Chen, M（陈敏）; Xiao, TQ（肖体乔）; Xiao, TQ (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China | |
| 2006 | |
| Source Publication | ACTA PHYSICA SINICA
 |
| ISSN | 1000-3290 |
| Volume | 55Issue:12Pages:6387 |
| Abstract | X-ray in-line outline imaging (XILOI) attracts much attention in recent years, for its simple setup compared with other approaches. Unfortunately, scattering effect cannot be removed directly, which restricts seriously the applications of this method to fields like biomedical radiography. The scattering effect in XILOI was investigated by digital simulation, in which the sample-detector distance (SDD) was changed step by step. The results show that there is a best imaging distance for the direct outline imaging and it is impossible to eliminate the scattering by arbitrarily changing the distance in this case. This difficulty could be overcome by quantitative phase contrast imaging( QPCI), in which SDD can be adjusted freely using a reconstruction algorithm. According to the investigation using QPCI, the scattering effect can be reduced to a minimum by increasing the SDD to a critical value, at which distinct improvement of the image quality can be achieved. |
| Keyword | Scattering X-ray In-line Outline Imaging Quantitative Phase Contrast Imaging |
| Subject Area | Chemistry |
| Indexed By | SCI |
| Language | 英语 |
| Funding Project | 应物所项目组 |
| WOS ID | WOS:000243900800032 |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/8250 |
| Collection | 中科院上海应用物理研究所2004-2010年 |
| Corresponding Author | Xiao, TQ (reprint author), Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China |
| Recommended Citation GB/T 7714 | Liu, LX,Du, GH,Hu, W,et al. Application of quantitative imaging to elimination of scattering effect on X-ray in-line outline imaging[J]. ACTA PHYSICA SINICA,2006,55(12):6387. |
| APA | Liu, LX.,Du, GH.,Hu, W.,Luo, YY.,Xie, HL.,...&Xiao, TQ .(2006).Application of quantitative imaging to elimination of scattering effect on X-ray in-line outline imaging.ACTA PHYSICA SINICA,55(12),6387. |
| MLA | Liu, LX,et al."Application of quantitative imaging to elimination of scattering effect on X-ray in-line outline imaging".ACTA PHYSICA SINICA 55.12(2006):6387. |
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