CAS OpenIR  > 中科院上海应用物理研究所2004-2010年
硅整流二极管组件低温性能测试
万理军; 郭兴龙; 潘衡; 徐风雨
2009
Source Publication低温与超导
Issue4
Abstract为了验证硅整流二极管组件在低温下能否正常工作,利用电流表、温度计和数据采集卡结合LabVIEW虚拟仪器软件组建的测试系统测试了组件在284K和77K下的伏安特性。实验结果表明组件在低温下依然呈现出二极管的各项性能,可以用于超导磁铁的失超保护系统。
Keyword硅整流二极管 超导磁铁 虚拟仪器
Indexed ByCNKI
Language中文
Funding Project应物所项目组
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/8493
Collection中科院上海应用物理研究所2004-2010年
Corresponding Author万理军
Recommended Citation
GB/T 7714
万理军,郭兴龙,潘衡,等. 硅整流二极管组件低温性能测试[J]. 低温与超导,2009(4).
APA 万理军,郭兴龙,潘衡,&徐风雨.(2009).硅整流二极管组件低温性能测试.低温与超导(4).
MLA 万理军,et al."硅整流二极管组件低温性能测试".低温与超导 .4(2009).
Files in This Item:
File Name/Size DocType Version Access License
硅整流二极管组件低温性能测试.pdf(208KB) 开放获取--View Application Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[万理军]'s Articles
[郭兴龙]'s Articles
[潘衡]'s Articles
Baidu academic
Similar articles in Baidu academic
[万理军]'s Articles
[郭兴龙]'s Articles
[潘衡]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[万理军]'s Articles
[郭兴龙]'s Articles
[潘衡]'s Articles
Terms of Use
No data!
Social Bookmark/Share
File name: 硅整流二极管组件低温性能测试.pdf
Format: Adobe PDF
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.