CAS OpenIR  > 中科院上海应用物理研究所2004-2010年
Geometric characterization of carbon nanotubes by atomic force microscopy in conjunction with a tip characterizer
Wang, CM; Itoh, H; Homma, Y; Sun, JL; Hu, J(胡钧); Ichimura, S
2008
Conference Name15th International Colloquium on Scanning Probe Microscopy (ICSPM 15)
Source PublicationJAPANESE JOURNAL OF APPLIED PHYSICS
Pages6128
Conference DateDEC 06-08, 2007
Conference PlaceAtagawa Heights, JAPAN
AbstractAn atomic force microscopy (AFM) probe tip characterizer with 14 line and space structures and two knife edges was fabricated by means of a superlattice technique. The shape of a probe tip both before and after AFM imaging was acquired by this tip characterizer with general variations < 1.5 nm; depending on imaging conditions. The geometric structures of carbon nanotubes (CNTs) on a SiO(2) substrate were studied by dynamic mode AFM in conjunction with this tip characterizer. Contact points between the tip and the CNTs were detected by observing changes in the AFM phase images. A modified CNT width correction model was established to calculate the estimated and Upper-limit widths of two CNTs. The experimental results showed that imaging under a weak attractive force was suitable for obtaining accurate CNT height measurements, whereas a weak repulsive force provided the most accurate widths. Differing heights and widths between the two CNTs suggested that one CNT was double-walled, whereas the other had more than two walls; these results agree with transmission electron microscopy (TEM) measurements of the CNTs.
ISSN0021-4922
Indexed BySCI
Funding Project应物所课题组
Language英语
Document Type会议论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/8845
Collection中科院上海应用物理研究所2004-2010年
Recommended Citation
GB/T 7714
Wang, CM,Itoh, H,Homma, Y,et al. Geometric characterization of carbon nanotubes by atomic force microscopy in conjunction with a tip characterizer[C],2008:6128.
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