Knowledge Management System Of Shanghai Institute of Applied Physics, CAS
| Shanghai electron beam ion trap: Design and current status | |
| Zhu, XK; Shugang, S; Yan, HP（阎和平）; Gong, PR（龚培龙）; Wang, N（王纳秀）; Shi, WG; Chen, YL; Xu, XY; Feng, SQ; Zhou, TT | |
| 2004 | |
| Conference Name | 9th International Symposium on Electron Beam Ion Sources and Traps and Their Applications |
| Source Publication | Ninth International Symposium on Electron Beam Ion Sources and Traps and Their Applications |
| Pages | 65 |
| Conference Date | APR 15-17, 2004 |
| Conference Place | Tokyo, JAPAN |
| Abstract | A new electron beam ion trap (EBIT) is under constructing in Shanghai. In this paper we describe the design and the features of this apparatus. Finally the current status of Shanghai-EBIT is shown. |
| ISSN | 1742-6588 |
| Indexed By | SCI |
| Funding Project | 应物所课题组 |
| Language | 英语 |
| Document Type | 会议论文 |
| Identifier | http://ir.sinap.ac.cn/handle/331007/8892 |
| Collection | 中科院上海应用物理研究所2004-2010年 |
| Recommended Citation GB/T 7714 | Zhu, XK,Shugang, S,Yan, HP,et al. Shanghai electron beam ion trap: Design and current status[C],2004:65. |
| Files in This Item: | Download All | |||||
| File Name/Size | DocType | Version | Access | License | ||
| Shanghai electron be（793KB） | 开放获取 | -- | View Download | |||
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