CAS OpenIR  > 中科院上海应用物理研究所2004-2010年
Analysis of vibrating mode scanning polarization force microscope
Chen, YH; Li, XJ; Zhou, XF(周星飞); Sun, JL(孙洁林); Huang, WH; Hu, J(胡钧)
2004
Source PublicationREVIEW OF SCIENTIFIC INSTRUMENTS
ISSN0034-6748
Volume75Issue:11Pages:4721
AbstractIn this article, the vibrating mode scanning polarization force microscope (VSPFM) is modeled with a spring-mass-damper system under van der Waals forces and polarization forces. The behaviors of VSPFM are analyzed numerically. Numerical analysis shows that by superimposing the long-range polarization interactions upon van der Waals forces, the tip motion can be greatly altered. Through adjusting the ac bias voltage between the conductive tip and dielectric substrate, the working regimes (intermittent contact or pure noncontact) of VSPFM can be controlled freely. The results also indicate that this kind of microscope is suitable for measuring mechanical properties of soft samples, where proper contact force is required. As an application example of VSPFM, the radial Young's modulus of DNA is determined. It is found the measured DNA modulus increases as deformation increases. This trend is the same with that observed in measuring elastic moduli of thin soft films on hard substrates. The elastic modulus is about 300 MPa if the ratio of deformation to DNA diameter is less than 30%. (C) 2004 American Institute of Physics.
Indexed BySCI
Language中文
Funding Project应物所项目组
WOS IDWOS:000224962900055
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.sinap.ac.cn/handle/331007/9387
Collection中科院上海应用物理研究所2004-2010年
Recommended Citation
GB/T 7714
Chen, YH,Li, XJ,Zhou, XF,et al. Analysis of vibrating mode scanning polarization force microscope[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2004,75(11):4721.
APA Chen, YH,Li, XJ,Zhou, XF,Sun, JL,Huang, WH,&Hu, J.(2004).Analysis of vibrating mode scanning polarization force microscope.REVIEW OF SCIENTIFIC INSTRUMENTS,75(11),4721.
MLA Chen, YH,et al."Analysis of vibrating mode scanning polarization force microscope".REVIEW OF SCIENTIFIC INSTRUMENTS 75.11(2004):4721.
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